Inventor · disambiguated record
Matthew S. Grady
Also filed as: GRADY MATTHEW S · GRADY MATTHEW SEAN
15 granted patents·3 pending applications·228 citations·filing 2000–2022
93Inventor score
Top patents by PatentIndex Score
18 records- 0196US7240322B2Method of adding fabrication monitors to integrated circuit chipsIBM·Filed 2005·Granted Jul 3, 2007·60 cites·18 claims
- 0286US6789032B2Method of statistical binning for reliability selectionIBM·Filed 2002·Granted Sep 7, 2004·63 cites·11 claims
- 0380US7194706B2Designing scan chains with specific parameter sensitivities to identify process defectsIBM·Filed 2004·Granted Mar 20, 2007·24 cites·26 claims
- 0475US6557132B2Method and system for determining common failure modes for integrated circuitsIBM·Filed 2001·Granted Apr 29, 2003·25 cites·13 claims
- 0573US7323278B2Method of adding fabrication monitors to integrated circuit chipsIBM·Filed 2007·Granted Jan 29, 2008·3 cites·9 claims
- 0670US6998866B1Circuit and method for monitoring defectsIBM·Filed 2004·Granted Feb 14, 2006·13 cites·30 claims
- 0766US8689066B2Integrated circuit test optimization using adaptive test pattern sampling algorithmGRADY MATTHEW S·Filed 2011·Granted Apr 1, 2014·5 cites·20 claims
- 0866US7139944B2Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliabilityIBM·Filed 2003·Granted Nov 21, 2006·15 cites·21 claims
- 0964US7620931B2Method of adding fabrication monitors to integrated circuit chipsIBM·Filed 2007·Granted Nov 17, 2009·1 cites·17 claims
- 1063US8087823B2Method for monitoring thermal controlAUBE FRANCOIS·Filed 2008·Granted Jan 3, 2012·8 cites·20 claims
- 1159US9336109B2Real-time rule engine for adaptive testing of integrated circuitsIBM·Filed 2013·Granted May 10, 2016·1 cites·12 claims
- 1256US2024213217A1Clustering fine pitch micro-bumps for packaging and testIBM·Filed 2022·Application pending·0 cites
- 1352US9311201B2Real-time rule engine for adaptive testing of integrated circuitsATKINSON DAVID E·Filed 2012·Granted Apr 12, 2016·1 cites·9 claims
- 1449US6754864B2System and method to predetermine a bitmap of a self-tested embedded arrayIBM·Filed 2001·Granted Jun 22, 2004·7 cites·15 claims
- 1543US6590382B2Signal pin tester for AC defects in integrated circuitsIBM·Filed 2000·Granted Jul 8, 2003·2 cites·2 claims
- 1640US2005172187A1Signal pin tester for AC defects in integrated circuitsFiled 2005·Application pending·0 cites
- 1739US2003151422A1Method for burn-in testingFiled 2002·Application pending·0 cites
- 1837US6909274B2Signal pin tester for AC defects in integrated circuitsIBM·Filed 2003·Granted Jun 21, 2005·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →