Inventor · disambiguated record
Malcolm J. Bevan
Also filed as: BEVAN MALCOLM · BEVAN MALCOLM J · BEVAN MALCOLM JOHN
48 granted patents·15 pending applications·338 citations·filing 1996–2025
98Inventor score
Files withAPPLIED MATERIALS INC27TEXAS INSTRUMENTS INC20BEVAN MALCOLM J4RAYTHEON CO2DRS TECHNOLOGIES INC1
Top patents by PatentIndex Score
63 records- 0191USD1034491SEdge ringAPPLIED MATERIALS INC·Filed 2020·Granted Jul 9, 2024·17 cites·1 claims
- 0290US11380575B2Film thickness uniformity improvement using edge ring and bias electrode geometryAPPLIED MATERIALS INC·Filed 2020·Granted Jul 5, 2022·2 cites·20 claims
- 0389US10872763B2Treatments to enhance material structuresAPPLIED MATERIALS INC·Filed 2019·Granted Dec 22, 2020·5 cites·16 claims
- 0489US9177806B2System and method for mitigating oxide growth in a gate dielectricBEVAN MALCOLM J·Filed 2011·Granted Nov 3, 2015·6 cites·12 claims
- 0589US2025385080A1Process chamber process kit with protective coatingAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0687US8778816B2In situ vapor phase surface activation of SiO2SATO TATSUYA E·Filed 2011·Granted Jul 15, 2014·9 cites·19 claims
- 0787US7906441B2System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2007·Granted Mar 15, 2011·6 cites·20 claims
- 0887US7045431B2Method for integrating high-k dielectrics in transistor devicesTEXAS INSTRUMENTS INC·Filed 2003·Granted May 16, 2006·42 cites·19 claims
- 0986US11581408B2Method and apparatus for selective nitridation processAPPLIED MATERIALS INC·Filed 2021·Granted Feb 14, 2023·1 cites·17 claims
- 1086US9831091B2Plasma treating a process chamberAPPLIED MATERIALS INC·Filed 2016·Granted Nov 28, 2017·4 cites·10 claims
- 1186US9054048B2NH3 containing plasma nitridation of a layer on a substrateLIU WEI·Filed 2012·Granted Jun 9, 2015·7 cites·16 claims
- 1286US7423326B2Integrated circuits with composite gate dielectricTEXAS INSTRUMENTS INC·Filed 2005·Granted Sep 9, 2008·11 cites·2 claims
- 1386US6919251B2Gate dielectric and methodTEXAS INSTRUMENTS INC·Filed 2002·Granted Jul 19, 2005·32 cites·10 claims
- 1485US9023700B2Method and apparatus for single step selective nitridationAPPLIED MATERIALS INC·Filed 2014·Granted May 5, 2015·5 cites·11 claims
- 1584US8481433B2Methods and apparatus for forming nitrogen-containing layersBEVAN MALCOLM J·Filed 2010·Granted Jul 9, 2013·6 cites·21 claims
- 1682US8748259B2Method and apparatus for single step selective nitridationGANGULY UDAYAN·Filed 2011·Granted Jun 10, 2014·5 cites·19 claims
- 1780US10049881B2Method and apparatus for selective nitridation processROGERS MATTHEW S·Filed 2012·Granted Aug 14, 2018·4 cites·7 claims
- 1879US2025239445A1Method and apparatus for selective deposition of dielectric filmsAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1977US6806149B2Sidewall processes using alkylsilane precursors for MOS transistor fabricationTEXAS INSTRUMENTS INC·Filed 2002·Granted Oct 19, 2004·22 cites·10 claims
- 2077US5838053AMethod of forming a cadmium telluride/silicon structureRAYTHEON TI SYST INC·Filed 1996·Granted Nov 17, 1998·42 cites·11 claims
- 2175US8546273B2Methods and apparatus for forming nitrogen-containing layersBEVAN MALCOLM J·Filed 2011·Granted Oct 1, 2013·3 cites·19 claims
- 2275US2024379349A1Treatments to enhance material structuresAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 2374US12487121B2Methods for calibrating an optical emission spectrometerAPPLIED MATERIALS INC·Filed 2024·Granted Dec 2, 2025·0 cites·20 claims
- 2473US10290504B2Plasma treating a process chamberAPPLIED MATERIALS INC·Filed 2017·Granted May 14, 2019·1 cites·16 claims
- 2573US6064066ABolometer autocalibrationTEXAS INSRUMENTS INC·Filed 1996·Granted May 16, 2000·49 cites·4 claims
- 2673US2023245863A1Process chamber process kit with protective coatingAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2771US12266560B2Film thickness uniformity improvement using edge ring and bias electrode geometryAPPLIED MATERIALS INC·Filed 2022·Granted Apr 1, 2025·0 cites·20 claims
- 2869US2023178419A1Scaled liner layer for isolation structureAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2968US11923441B2Gate all around I/O engineeringAPPLIED MATERIALS INC·Filed 2022·Granted Mar 5, 2024·0 cites·15 claims
- 3067US10068771B2System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2018·Granted Sep 4, 2018·0 cites·19 claims
- 3167US7339240B2Dual-gate integrated circuit semiconductor deviceTEXAS INSTRUMENTS INC·Filed 2006·Granted Mar 4, 2008·2 cites·4 claims
- 3266US11450759B2Gate all around I/O engineeringAPPLIED MATERIALS INC·Filed 2020·Granted Sep 20, 2022·0 cites·19 claims
- 3366US6921703B2System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2003·Granted Jul 26, 2005·10 cites·7 claims
- 3465US9892927B2System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2017·Granted Feb 13, 2018·0 cites·30 claims
- 3564US9779946B2System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2017·Granted Oct 3, 2017·0 cites·23 claims
- 3664US2021043448A1Method and Apparatus for Selective Deposition of Dielectric FilmsAPPLIED MATERIALS INC·Filed 2020·Application pending·0 cites
- 3763US9576804B2System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2016·Granted Feb 21, 2017·0 cites·20 claims
- 3862US11456178B2Gate interface engineering with doped layerAPPLIED MATERIALS INC·Filed 2021·Granted Sep 27, 2022·0 cites·20 claims
- 3962US9337046B1System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2016·Granted May 10, 2016·0 cites·23 claims
- 4061US12354843B2Process chamber process kit with protective coatingAPPLIED MATERIALS INC·Filed 2019·Granted Jul 8, 2025·0 cites·21 claims
- 4161US9396951B2System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2015·Granted Jul 19, 2016·0 cites·30 claims
- 4261US9368355B2System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2015·Granted Jun 14, 2016·0 cites·30 claims
- 4361US9337044B2System and method for mitigating oxide growth in a gate dielectricTEXAS INSTRUMENTS INC·Filed 2015·Granted May 10, 2016·0 cites·30 claims
- 4461US2020161171A1Scaled liner layer for isolation structureAPPLIED MATERIALS INC·Filed 2019·Application pending·0 cites
- 4560US11927482B2Methods for calibrating an optical emission spectrometerAPPLIED MATERIALS INC·Filed 2020·Granted Mar 12, 2024·0 cites·20 claims
- 4660US10950698B2Method and apparatus for selective nitridation processAPPLIED MATERIALS INC·Filed 2018·Granted Mar 16, 2021·0 cites·20 claims
- 4760US7049242B2Post high voltage gate dielectric pattern plasma surface treatmentTEXAS INSTRUMENTS INC·Filed 2004·Granted May 23, 2006·6 cites·21 claims
- 4860US7018925B2Post high voltage gate oxide pattern high-vacuum outgas surface treatmentTEXAS INSTRUMENTS INC·Filed 2004·Granted Mar 28, 2006·6 cites·11 claims
- 4956US11271097B2Cap oxidation for FinFET formationAPPLIED MATERIALS INC·Filed 2020·Granted Mar 8, 2022·0 cites·20 claims
- 5054US2018211833A1Method And Apparatus For Selective Deposition Of Dielectric FilmsAPPLIED MATERIALS INC·Filed 2018·Application pending·0 cites
Showing the top 50 of 63 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →