Inventor · disambiguated record
Jochen Rivoir
Also filed as: RIVOIR JOCHEN
50 granted patents·5 pending applications·364 citations·filing 1998–2024
98Inventor score
Files withRIVOIR JOCHEN15AGILENT TECHNOLOGIES INC13VERIGY PTE LTD SINGAPORE10ADVANTEST CORP8ADVANTEST SINGAPORE PTE LTD2
Top patents by PatentIndex Score
55 records- 0193US7590903B2Re-configurable architecture for automated test equipmentVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Sep 15, 2009·28 cites·17 claims
- 0288US6972704B2Sigma-delta modulator with PWM outputAGILENT TECHNOLOGIES INC·Filed 2004·Granted Dec 6, 2005·38 cites·10 claims
- 0386US7791525B2Time-to-digital conversion with calibration pulse injectionVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Sep 7, 2010·14 cites·16 claims
- 0484US8253605B2Decorrelation of data by using this dataRIVOIR JOCHEN·Filed 2007·Granted Aug 28, 2012·14 cites·22 claims
- 0583US7512858B2Method and system for per-pin clock synthesis of an electronic device under testVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Mar 31, 2009·10 cites·15 claims
- 0682US8838406B2Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipmentRIVOIR JOCHEN·Filed 2008·Granted Sep 16, 2014·9 cites·49 claims
- 0781US7248200B2Analog to digital conversion method using track/hold circuit and time interval analyzer, and an apparatus using the methodAGILENT TECHNOLOGIES INC·Filed 2006·Granted Jul 24, 2007·13 cites·30 claims
- 0877US6993695B2Method and apparatus for testing digital devices using transition timestampsAGILENT TECHNOLOGIES INC·Filed 2001·Granted Jan 31, 2006·23 cites·36 claims
- 0973US7414558B2Digital to analog conversion using summation of multiple DACsVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 19, 2008·10 cites·15 claims
- 1072US8169212B2Calibrating signals by time adjustmentRIVOIR JOCHEN·Filed 2006·Granted May 1, 2012·6 cites·21 claims
- 1172US6462693B1Analog to digital signal conversion method and apparatusAGILENT TECHNOLOGIES INC·Filed 2001·Granted Oct 8, 2002·18 cites·22 claims
- 1271US11200156B2Tester and method for testing a device under test using relevance scoresADVANTEST CORP·Filed 2019·Granted Dec 14, 2021·1 cites·19 claims
- 1371US9341673B2Device under test data processing techniquesADVANTEST SINGAPORE PTE LTD·Filed 2014·Granted May 17, 2016·2 cites·17 claims
- 1471US8886987B2Data processing unit and a method of processing dataRIVOIR JOCHEN·Filed 2008·Granted Nov 11, 2014·5 cites·31 claims
- 1571US8418010B2Format transformation of test dataRIVOIR JOCHEN·Filed 2006·Granted Apr 9, 2013·5 cites·23 claims
- 1670US8797046B2Method of sharing a test resource at a plurality of test sites, automated test equipment, handler for loading and unloading devices to be tested and test systemRIVOIR JOCHEN·Filed 2008·Granted Aug 5, 2014·6 cites·11 claims
- 1770US7782242B2Time-to-digital conversion with delay contribution determination of delay elementsVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Aug 24, 2010·7 cites·13 claims
- 1869US6717540B1Signal preconditioning for analog-to-digital conversion with timestampsAGILENT TECHNOLOGIES INC·Filed 2002·Granted Apr 6, 2004·17 cites·33 claims
- 1968US7137053B2Bandwidth matching for scan architectures in an integrated circuitVERIGG IPCO·Filed 2001·Granted Nov 14, 2006·18 cites·21 claims
- 2067US8825424B2Apparatus and method for estimating data relating to a time difference and apparatus and method for calibrating a delay lineRIVOIR JOCHEN·Filed 2008·Granted Sep 2, 2014·3 cites·16 claims
- 2166US7434118B2Parameterized signal conditioningVERIGY PTE LTD SINGAPORE·Filed 2004·Granted Oct 7, 2008·14 cites·25 claims
- 2265US8378707B2Evaluation of an output signal of a device under testADVANTEST SINGAPORE PTE LTD·Filed 2006·Granted Feb 19, 2013·4 cites·11 claims
- 2365US7672804B2Analog signal test using a-priori informationAGILENT TECHNOLOGIES INC·Filed 2007·Granted Mar 2, 2010·4 cites·13 claims
- 2465US7366937B2Fast synchronization of a number of digital clocksVERIGY PTE LTD SINGAPORE·Filed 2005·Granted Apr 29, 2008·3 cites·17 claims
- 2564US8745568B2Method and apparatus for determining relevance values for a detection of a fault on a chip and for determining a fault probability of a location on a chipRIVOIR JOCHEN·Filed 2008·Granted Jun 3, 2014·3 cites·21 claims
- 2663US12124359B2Systems and methods for device testing to avoid resource conflicts for a large number of test scenariosADVANTEST CORP·Filed 2022·Granted Oct 22, 2024·0 cites·20 claims
- 2762US6429799B1Method and apparatus for analog to digital conversion using time-varying reference signalAGILENT TECHNOLOGIES INC·Filed 2001·Granted Aug 6, 2002·13 cites·24 claims
- 2862US6105087AEvent recognition by a state machine whose state is dependent upon historical informationHEWLETT PACKARD CO·Filed 1998·Granted Aug 15, 2000·39 cites·13 claims
- 2961US9164726B2Apparatus for determining a number of successive equal bits preceding an edge within a bit stream and apparatus for reconstructing a repetitive bit sequenceRIVOIR JOCHEN·Filed 2010·Granted Oct 20, 2015·1 cites·24 claims
- 3061US7230556B2Analog signal generation using a delta-sigma modulatorRIVOIR JOCHEN·Filed 2005·Granted Jun 12, 2007·4 cites·8 claims
- 3159US11105855B2Tester and method for testing a device under test and tester and method for determining a single decision functionADVANTEST CORP·Filed 2019·Granted Aug 31, 2021·0 cites·20 claims
- 3259US9847843B2Apparatus and method for wireless testing of a plurality of transmit paths and a plurality of receive paths of an electronic deviceRIVOIR JOCHEN·Filed 2009·Granted Dec 19, 2017·2 cites·23 claims
- 3359US9140750B2Apparatus comprising a recursive delayer and method for measuring a phase noisePAUSINI MARCO·Filed 2009·Granted Sep 22, 2015·4 cites·31 claims
- 3459US6732312B2Test vector compression methodAGILENT TECHNOLOGIES INC·Filed 2001·Granted May 4, 2004·8 cites·42 claims
- 3559US2025004039A1METHOD AND APPARATUS FOR DETERMINING AND INFORMATION ABOUT CHARACTERISTICS OF ONE OR MORE DEVICES UNDER TEST, DUTs, USING A STATISTICALLY SIGNIFICANT DISSIMILARITY VALUEADVANTEST CORP·Filed 2024·Application pending·0 cites
- 3657US9658282B2Techniques for determining a fault probability of a location on a chipRIVOIR JOCHEN·Filed 2014·Granted May 23, 2017·0 cites·6 claims
- 3757US7847716B2Asynchronous sigma-delta digital-analog converterVERIGY PTE LTD SINGAPORE·Filed 2006·Granted Dec 7, 2010·3 cites·17 claims
- 3855US9575726B2Bit sequence generator and apparatus for calculating a sub-rate transition matrix and a sub-rate initial state for a state machine of a plurality of state machinesRIVOIR JOCHEN·Filed 2010·Granted Feb 21, 2017·1 cites·20 claims
- 3953US11187743B2Automated test equipment for combined signalsADVANTEST CORP·Filed 2017·Granted Nov 30, 2021·0 cites·19 claims
- 4051US11036623B2Test apparatus and method for characterizing a device under testADVANTEST CORP·Filed 2019·Granted Jun 15, 2021·0 cites·17 claims
- 4150US11182274B2Test apparatus for performing a test on a device under test and data set filter for filtering a data set to obtain a best setting of a device under testADVANTEST CORP·Filed 2019·Granted Nov 23, 2021·0 cites·13 claims
- 4249US8880574B2State machine and generator for generating a description of a state machine feedback functionRIVOIR JOCHEN·Filed 2008·Granted Nov 4, 2014·0 cites·23 claims
- 4349US7136770B2Using component-level calibration data to reduce system-level testAGILENT TECHNOLOGIES INC·Filed 2003·Granted Nov 14, 2006·2 cites·12 claims
- 4448US10775437B2Test apparatus and method for testing a device under testADVANTEST CORP·Filed 2016·Granted Sep 15, 2020·0 cites·26 claims
- 4548US6735728B1Unidirectional verification of bus-based systemsAGILENT TECHNOLOGIES INC·Filed 2000·Granted May 11, 2004·6 cites·16 claims
- 4646US7248660B2Transition trackingVERIGY PTE LTD SINGAPORE·Filed 2003·Granted Jul 24, 2007·0 cites·17 claims
- 4744US2007126414A1Jitter generationAGILENT TECHNOLOGIES INC·Filed 2006·Application pending·0 cites
- 4842US9103887B2Method and apparatus for adjusting transitions in a bit streamRIVOIR JOCHEN·Filed 2003·Granted Aug 11, 2015·1 cites·3 claims
- 4942US2006040654A1Method of system for testing a wireless deviceMOORE GEORGE S·Filed 2004·Application pending·0 cites
- 5040US7119720B2Precision pulse placement to form a binary pulse signalAGILENT TECHNOLOGIES INC·Filed 2005·Granted Oct 10, 2006·0 cites·11 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →