Inventor · disambiguated record
Junwei Wei
Also filed as: WEI JUNWEI
3 granted patents·32 citations·filing 2015–2017
67Inventor score
Technology areasG01N
Files withKLA TENCOR CORP3
Top patents by PatentIndex Score
3 records- 0194US9709510B2Determining a configuration for an optical element positioned in a collection aperture during wafer inspectionKLA TENCOR CORP·Filed 2015·Granted Jul 18, 2017·23 cites·39 claims
- 0293US10082470B2Defect marking for semiconductor wafer inspectionKLA TENCOR CORP·Filed 2017·Granted Sep 25, 2018·9 cites·21 claims
- 0357US10215713B2Determining a configuration for an optical element positioned in a collection aperture during wafer inspectionKLA TENCOR CORP·Filed 2017·Granted Feb 26, 2019·0 cites·40 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →