Inventor · disambiguated record
Carole D. Graas
Also filed as: GRAAS CAROLE · GRAAS CAROLE D
22 granted patents·3 pending applications·204 citations·filing 1993–2020
95Inventor score
Top patents by PatentIndex Score
25 records- 0194US10309919B2Moisture detection and ingression monitoring systems and methods of manufactureIBM·Filed 2018·Granted Jun 4, 2019·5 cites·13 claims
- 0293US10126260B2Moisture detection and ingression monitoring systems and methods of manufactureIBM·Filed 2015·Granted Nov 13, 2018·5 cites·20 claims
- 0391US10324056B2Moisture detection and ingression monitoring systems and methods of manufactureIBM·Filed 2018·Granted Jun 18, 2019·3 cites·9 claims
- 0490US10388567B2Thru-silicon-via structuresGLOBALFOUNDRIES INC·Filed 2017·Granted Aug 20, 2019·6 cites·19 claims
- 0589US9812359B2Thru-silicon-via structuresIBM·Filed 2015·Granted Nov 7, 2017·6 cites·4 claims
- 0688US10989754B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Apr 27, 2021·2 cites·13 claims
- 0788US10564214B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Feb 18, 2020·2 cites·12 claims
- 0887US9739824B2Optimization of integrated circuit reliabilityIBM·Filed 2016·Granted Aug 22, 2017·2 cites·10 claims
- 0987US6603321B2Method and apparatus for accelerated determination of electromigration characteristics of semiconductor wiringIBM·Filed 2001·Granted Aug 5, 2003·49 cites·26 claims
- 1083US8201038B2Integrating design for reliability technology into integrated circuitsGRAAS CAROLE D·Filed 2009·Granted Jun 12, 2012·15 cites·21 claims
- 1183US5360995ABuffered capped interconnect for a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1993·Granted Nov 1, 1994·65 cites·4 claims
- 1282US10545110B2Moisture detection and ingression monitoring systems and methods of manufactureIBM·Filed 2019·Granted Jan 28, 2020·2 cites·13 claims
- 1374US6570181B1Semiconductor metal interconnect reliability test structureTEXAS INSTRUMENTS INC·Filed 2000·Granted May 27, 2003·24 cites·18 claims
- 1472US10996259B2Optimization of integrated circuit reliabilityIBM·Filed 2020·Granted May 4, 2021·0 cites·17 claims
- 1571US11054459B2Optimization of integrated circuit reliabilityIBM·Filed 2019·Granted Jul 6, 2021·0 cites·15 claims
- 1671US10900923B2Moisture detection and ingression monitoring systems and methods of manufactureIBM·Filed 2019·Granted Jan 26, 2021·0 cites·18 claims
- 1762US6566211B2Surface modified interconnectsTEXAS INSTRUMENTS INC·Filed 2001·Granted May 20, 2003·8 cites·8 claims
- 1860US10545111B1Moisture detection and ingression monitoring systems and methods of manufactureIBM·Filed 2019·Granted Jan 28, 2020·0 cites·12 claims
- 1956US9395403B2Optimization of integrated circuit reliabilityIBM·Filed 2013·Granted Jul 19, 2016·0 cites·20 claims
- 2043US6355983B2Surface modified interconnectsTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 12, 2002·10 cites·1 claims
- 2136US2012259575A1Integrated circuit chip incorporating a test circuit that allows for on-chip stress testing in order to model or monitor device performance degradationGRAAS CAROLE D·Filed 2011·Application pending·0 cites
- 2235US2018138209A1Semiconductor substrate with metallic doped buried oxideGLOBALFOUNDRIES INC·Filed 2016·Application pending·0 cites
- 2333US11031358B2Overhang model for reducing passivation stress and method for producing the sameMARVELL INT LTD·Filed 2018·Granted Jun 8, 2021·0 cites·7 claims
- 2433US8729920B2Circuit and method for RAS-enabled and self-regulated frequency and delay sensorGRAAS CAROLE D·Filed 2010·Granted May 20, 2014·0 cites·21 claims
- 2531US2016225919A1Device structure with negative resistance characteristicsGLOBALFOUNDRIES INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →