Inventor · disambiguated record
Subramanian Karthikeyan
Also filed as: KARTHIKEYAN SUBRAMANIAN
7 granted patents·3 pending applications·82 citations·filing 2000–2007
85Inventor score
Top patents by PatentIndex Score
10 records- 0184US7301107B2Semiconductor device having reduced intra-level and inter-level capacitanceAGERE SYSTEMS INC·Filed 2003·Granted Nov 27, 2007·37 cites·8 claims
- 0275US7388395B2Test semiconductor device and method for determining Joule heating effects in such a deviceAGERE SYSTEMS INC·Filed 2006·Granted Jun 17, 2008·4 cites·6 claims
- 0370US6309900B1Test structures for testing planarization systems and methods for using sameAGERE SYST GUARDIAN CORP·Filed 2000·Granted Oct 30, 2001·14 cites·4 claims
- 0467US7061264B2Test semiconductor device and method for determining Joule heating effects in such a deviceAGERE SYSTEMS INC·Filed 2004·Granted Jun 13, 2006·9 cites·9 claims
- 0564US7067419B2Mask layer and dual damascene interconnect structure in a semiconductor deviceAGERE SYSTEMS INC·Filed 2003·Granted Jun 27, 2006·12 cites·19 claims
- 0653US7804291B2Semiconductor test device with heating circuitAGERE SYSTEMS INC·Filed 2007·Granted Sep 28, 2010·2 cites·11 claims
- 0750US7005375B2Method to avoid copper contamination of a via or dual damascene structureAGERE SYSTEMS INC·Filed 2002·Granted Feb 28, 2006·4 cites·39 claims
- 0837US2003213617A1Method and structure of a reducing intra-level and inter-level capacitance of a semiconductor deviceFiled 2002·Application pending·0 cites
- 0935US2003119305A1Mask layer and dual damascene interconnect structure in a semiconductor deviceFiled 2001·Application pending·0 cites
- 1035US2006066335A1Semiconductor test device with heating circuitKANG SEUNG H·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →