Inventor · disambiguated record
Theresa Kramer Guarini
Also filed as: GUARINI THERESA K · GUARINI THERESA KRAMER
25 granted patents·17 pending applications·78 citations·filing 2006–2025
94Inventor score
Top patents by PatentIndex Score
42 records- 0196US9683308B2Method and apparatus for precleaning a substrate surface prior to epitaxial growthAPPLIED MATERIALS INC·Filed 2014·Granted Jun 20, 2017·8 cites·7 claims
- 0294US9460920B1Horizontal gate all around device isolationAPPLIED MATERIALS INC·Filed 2015·Granted Oct 4, 2016·15 cites·20 claims
- 0391USD1034491SEdge ringAPPLIED MATERIALS INC·Filed 2020·Granted Jul 9, 2024·17 cites·1 claims
- 0490US11380575B2Film thickness uniformity improvement using edge ring and bias electrode geometryAPPLIED MATERIALS INC·Filed 2020·Granted Jul 5, 2022·2 cites·20 claims
- 0590US2024301584A1Method and apparatus for precleaning a substrate surface prior to epitaxial growthAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0689US2025385080A1Process chamber process kit with protective coatingAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0787US9865735B2Horizontal gate all around and FinFET device isolationAPPLIED MATERIALS INC·Filed 2016·Granted Jan 9, 2018·4 cites·14 claims
- 0886US9831091B2Plasma treating a process chamberAPPLIED MATERIALS INC·Filed 2016·Granted Nov 28, 2017·4 cites·10 claims
- 0985US9023700B2Method and apparatus for single step selective nitridationAPPLIED MATERIALS INC·Filed 2014·Granted May 5, 2015·5 cites·11 claims
- 1085US7972933B2Method of selective nitridationAPPLIED MATERIALS INC·Filed 2010·Granted Jul 5, 2011·7 cites·20 claims
- 1183US11145761B2Horizontal gate all around and FinFET device isolationAPPLIED MATERIALS INC·Filed 2019·Granted Oct 12, 2021·2 cites·17 claims
- 1282US9177787B2NH3 containing plasma nitridation of a layer of a three dimensional structure on a substrateAPPLIED MATERIALS INC·Filed 2014·Granted Nov 3, 2015·5 cites·12 claims
- 1382US8748259B2Method and apparatus for single step selective nitridationGANGULY UDAYAN·Filed 2011·Granted Jun 10, 2014·5 cites·19 claims
- 1481US10837122B2Method and apparatus for precleaning a substrate surface prior to epitaxial growthAPPLIED MATERIALS INC·Filed 2019·Granted Nov 17, 2020·0 cites·19 claims
- 1579US2025239445A1Method and apparatus for selective deposition of dielectric filmsAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1676US10573719B2Horizontal gate all around device isolationAPPLIED MATERIALS INC·Filed 2016·Granted Feb 25, 2020·2 cites·19 claims
- 1774US12487121B2Methods for calibrating an optical emission spectrometerAPPLIED MATERIALS INC·Filed 2024·Granted Dec 2, 2025·0 cites·20 claims
- 1873US10428441B2Method and apparatus for precleaning a substrate surface prior to epitaxial growthAPPLIED MATERIALS INC·Filed 2017·Granted Oct 1, 2019·0 cites·14 claims
- 1973US10290504B2Plasma treating a process chamberAPPLIED MATERIALS INC·Filed 2017·Granted May 14, 2019·1 cites·16 claims
- 2073US2021010160A1Method and apparatus for precleaning a substrate surface prior to epitaxial growthAPPLIED MATERIALS INC·Filed 2020·Application pending·0 cites
- 2173US2023245863A1Process chamber process kit with protective coatingAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2272US10490666B2Horizontal gate all around and FinFET device isolationAPPLIED MATERIALS INC·Filed 2017·Granted Nov 26, 2019·1 cites·17 claims
- 2371US12266560B2Film thickness uniformity improvement using edge ring and bias electrode geometryAPPLIED MATERIALS INC·Filed 2022·Granted Apr 1, 2025·0 cites·20 claims
- 2469US2023178419A1Scaled liner layer for isolation structureAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 2568US11923441B2Gate all around I/O engineeringAPPLIED MATERIALS INC·Filed 2022·Granted Mar 5, 2024·0 cites·15 claims
- 2666US11450759B2Gate all around I/O engineeringAPPLIED MATERIALS INC·Filed 2020·Granted Sep 20, 2022·0 cites·19 claims
- 2764US2021043448A1Method and Apparatus for Selective Deposition of Dielectric FilmsAPPLIED MATERIALS INC·Filed 2020·Application pending·0 cites
- 2863US2025239452A1Direct nitration for backside power deliver network isolation moduleAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 2962US2025183036A1Selective silicon nitride with treatment for contact formation in logic or memory devicesAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 3061US12354843B2Process chamber process kit with protective coatingAPPLIED MATERIALS INC·Filed 2019·Granted Jul 8, 2025·0 cites·21 claims
- 3161US2020161171A1Scaled liner layer for isolation structureAPPLIED MATERIALS INC·Filed 2019·Application pending·0 cites
- 3260US11927482B2Methods for calibrating an optical emission spectrometerAPPLIED MATERIALS INC·Filed 2020·Granted Mar 12, 2024·0 cites·20 claims
- 3360US2024339318A1Segmented formation of gate interfaceAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 3460US2024234133A1Treatments to enhance material structuresAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 3559US2025372369A1Methods of fabricating high-k gate structuresAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 3654US2018211833A1Method And Apparatus For Selective Deposition Of Dielectric FilmsAPPLIED MATERIALS INC·Filed 2018·Application pending·0 cites
- 3750US10971357B2Thin film treatment processAPPLIED MATERIALS INC·Filed 2018·Granted Apr 6, 2021·0 cites·20 claims
- 3849US2009162570A1Apparatus and method for processing a substrate using inductively coupled plasma technologyAPPLIED MATERIALS INC·Filed 2007·Application pending·0 cites
- 3946US8144329B2Low power RF tuning using optical and non-reflected power methodsCRUSE JAMES P·Filed 2011·Granted Mar 27, 2012·0 cites·18 claims
- 4045US2008003702A1Low Power RF Tuning Using Optical and Non-Reflected Power MethodsCRUSE JAMES P·Filed 2006·Application pending·0 cites
- 4142US2011011743A1Low power rf tuning using optical and non-reflected power methodsCRUSE JAMES P·Filed 2010·Application pending·0 cites
- 4228US8163626B2Enhancing NAND flash floating gate performanceSWENBURG JOHANES·Filed 2010·Granted Apr 24, 2012·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →