Inventor · disambiguated record
Joseph Shamir
Also filed as: SHAMIR JOSEPH
13 granted patents·2 pending applications·701 citations·filing 1989–2022
94Inventor score
Files withBROWN & SHARPE SURFACE INSPECT4PARTICLE MEASURING SYST3UNIV ALABAMA2P M L PARTICLES MONITORING TEC1P M L PARTICLES MONITORING TECHNOLOGIES LTD1
Top patents by PatentIndex Score
15 records- 0198US10921229B2Detection scheme for particle size and concentration measurementPARTICLE MEASURING SYST·Filed 2017·Granted Feb 16, 2021·25 cites·8 claims
- 0297US5515184AWaveguide hologram illuminatorsUNIV ALABAMA·Filed 1992·Granted May 7, 1996·273 cites·9 claims
- 0389US6294793B1High speed optical inspection apparatus for a transparent disk using gaussian distribution analysis and method thereforBROWN & SHARPE SURFACE INSPECT·Filed 1992·Granted Sep 25, 2001·100 cites·101 claims
- 0489US5004309ANeural processor with holographic optical paths and nonlinear operating meansTELEDYNE BROWN ENGINEERING·Filed 1989·Granted Apr 2, 1991·87 cites·20 claims
- 0588US7746469B2Method for particle size and concentration measurementP M L PARTICLES MONITORING TEC·Filed 2004·Granted Jun 29, 2010·48 cites·34 claims
- 0686US5854697AWaveguide hologram illuminatorsUNIV ALABAMA·Filed 1995·Granted Dec 29, 1998·82 cites·9 claims
- 0779US12313514B2Detection scheme for particle size and concentration measurementPARTICLE MEASURING SYST·Filed 2022·Granted May 27, 2025·0 cites·9 claims
- 0873US2020150018A1Detection scheme for particle size and concentration measurementPARTICLE MEASURING SYST·Filed 2019·Application pending·0 cites
- 0962US6262432B1High speed surface inspection optical apparatus for a reflective disk using gaussian distribution analysis and method thereforBROWN & SHARPE SURFACE INSPECT·Filed 1992·Granted Jul 17, 2001·27 cites·96 claims
- 1060US6645787B2Gamma ray detectorTECHNION RES & DEV FOUNDATION·Filed 2002·Granted Nov 11, 2003·12 cites·46 claims
- 1160US5132813ANeural processor with holographic optical paths and nonlinear operating meansTELEDYNE IND·Filed 1990·Granted Jul 21, 1992·21 cites·14 claims
- 1260US2015260628A1Detection scheme for particle size and concentration measurementP M L PARTICLES MONITORING TECHNOLOGIES LTD·Filed 2012·Application pending·0 cites
- 1355US6252242B1High speed optical inspection apparatus using Gaussian distribution analysis and method thereforeBROWN & SHARPE SURFACE INSPECT·Filed 1992·Granted Jun 26, 2001·20 cites·107 claims
- 1435US4979828APhase conjugate interferometer for measuring thin film propertiesUNIV TUFTS·Filed 1989·Granted Dec 25, 1990·5 cites·11 claims
- 1527US6255666B1High speed optical inspection apparatus for a large transparent flat panel using gaussian distribution analysis and method thereforBROWN & SHARPE SURFACE INSPECT·Filed 1992·Granted Jul 3, 2001·1 cites·75 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →