US2020150018A1PendingUtilityA1
Detection scheme for particle size and concentration measurement
Est. expiryDec 1, 2031(~5.3 yrs left)· nominal 20-yr term from priority
Inventors:Joseph Shamir
G01N 15/06G01N 15/1436G01N 15/0205G01N 2015/145G01N 15/1456G01N 15/1459G01N 2015/1454G01N 15/1434G01N 2015/0693G01N 15/075
73
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
The present invention provides a system and method of particle size and concentration measurement that comprises the steps of: providing a focused, synthesized, structured laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration.
Claims
exact text as granted — not AI-modified1 - 9 . (canceled)
10 . A particle monitoring system comprising:
a particle interrogation region; a light source configured to produce a structured laser beam directed at the particle interrogation region, the structured laser beam having first and second intensity lobes; a first detector positioned to detect the first intensity lobe of the beam after the beam has passed through the particle interrogation region; and a second detector, spaced apart from the first detector and positioned to detect the second intensity lobe of the beam after the beam has passed through the interrogation region.
11 . The particle monitoring system of claim 10 , wherein the light source comprises a Gaussian laser beam.
12 . The particle monitoring system of claim 10 , configured to record a differential signal from the first and second detectors.
13 . The particle monitoring system of claim 10 , configured to record a first signal from the first detector and a second signal from the second detector.
14 . The particle monitoring system of claim 10 , configured to record a summed signal from the first and second detectors.
15 . The particle monitoring system of claim 10 , wherein the structured laser beam is a structured dark beam.
16 . The particle monitoring system of claim 10 , wherein the structured laser beam is configured such that a focal region of the structured laser beam occurs in the particle interrogation region.
17 . The particle monitoring system of claim 10 , wherein the particle interrogation region comprises a cuvette.
18 . The particle monitoring system of claim 10 comprising a processor configured to carry out algorithms to analyze signals from the first and second detectors.
19 . The particle monitoring system of claim 10 , comprising a validation filter configured to validate that a particle interaction occurred in a focal zone of the structured laser beam.
20 . A method of particle monitoring comprising:
flowing particles through a particle interrogation region of a particle monitoring system; producing a structured laser beam via a light source of the particle monitoring system, the structured laser beam having first and second intensity lobes; directing the structured laser beam at the particle interrogation region; detecting the first intensity lobe of the beam after the beam has passed through the particle interrogation region via a first detector; and detecting the second intensity lobe of the beam after the beam has passed through the interrogation region via a second detector, the second detector spaced apart from the first detector.
21 . The method of claim 20 , comprising measuring a concentration of a subset of particles in a population of particles, via the particle monitoring system, wherein the particles of the subset are larger in size than the rest of the population of particles.
22 . The method of claim 21 , wherein the step of measuring the concentration of the subset of particles comprises configuring the structured laser beam such that a majority of particles of the population are filtered out by the particle monitoring system as background noise.
23 . The method of claim 22 , wherein the step of configuring the structured laser beam comprises tuning a spot size of the structured laser beam.
24 . The method of claim 21 , wherein the subset of particles comprises 1 one-millionth or less of the population of particles.
25 . The method of claim 20 , comprising analyzing signals from the first and second detectors via a processor of the particle monitoring system.
26 . The method of claim 25 , wherein the particles are suspended in a liquid, and wherein analyzing step comprises distinguishing particles from bubbles in the liquid.
27 . The method of claim 25 , wherein the analyzing step comprises recording a differential signal from the first and second detectors.
28 . The method of claim 25 , wherein the analyzing step comprises recording a first signal from the first detector and a second signal from the second detector.
29 . The method of claim 25 , wherein the analyzing step comprises recording a summed signal from the first and second detectors.
30 . The method of claim 25 , wherein the analyzing step comprises applying a validation filter to validate that a particle interaction occurred in a focal zone of the structured laser beam.
31 . The method of claim 25 , wherein the analyzing step comprises classifying the particles via artificial intelligence clustering.
32 . The method of claim 20 , wherein the light source comprises a Gaussian laser beam.Join the waitlist — get patent alerts
Track US2020150018A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.