Inventor · disambiguated record
Chris W. Lee
Also filed as: LEE CHRIS · LEE CHRIS W
5 granted patents·1 pending application·40 citations·filing 2005–2023
76Inventor score
Top patents by PatentIndex Score
6 records- 0191US9601393B2Selecting one or more parameters for inspection of a waferLEE CHRIS·Filed 2010·Granted Mar 21, 2017·17 cites·69 claims
- 0291US9310316B2Selecting parameters for defect detection methodsWU KENONG·Filed 2012·Granted Apr 12, 2016·15 cites·35 claims
- 0387US8948494B2Unbiased wafer defect samplesKLA TENCOR CORP·Filed 2013·Granted Feb 3, 2015·6 cites·20 claims
- 0455US2024321793A1Chip package assembly with enhanced solder pitchXILINX INC·Filed 2023·Application pending·0 cites
- 0548US9037280B2Computer-implemented methods for performing one or more defect-related functionsDISHNER MARK·Filed 2005·Granted May 19, 2015·2 cites·46 claims
- 0631US8392136B2In-place management of semiconductor equipment recipesLEE CHRIS W·Filed 2010·Granted Mar 5, 2013·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →