Inventor · disambiguated record
David Cheng
Also filed as: CHENG DAVID · CHENG DAVID H · CHENG DAVID H S
53 granted patents·11 pending applications·6,860 citations·filing 1977–2025
99Inventor score
Top patents by PatentIndex Score
64 records- 0198US5882165AMultiple chamber integrated process systemAPPLIED MATERIALS INC·Filed 1997·Granted Mar 16, 1999·789 cites·8 claims
- 0298US5851299APassive shield for CVD wafer processing which provides frontside edge exclusion and prevents backside depositionsAPPLIED MATERIALS INC·Filed 1994·Granted Dec 22, 1998·402 cites·34 claims
- 0398US5028565AProcess for CVD deposition of tungsten layer on semiconductor waferAPPLIED MATERIALS INC·Filed 1989·Granted Jul 2, 1991·387 cites·18 claims
- 0498US4951601AMulti-chamber integrated process systemAPPLIED MATERIALS INC·Filed 1989·Granted Aug 28, 1990·1.3k cites·22 claims
- 0597US6164894AMethod and apparatus for integrated wafer handling and testingFiled 1997·Granted Dec 26, 2000·448 cites·16 claims
- 0697US4842683AMagnetic field-enhanced plasma etch reactorAPPLIED MATERIALS INC·Filed 1988·Granted Jun 27, 1989·410 cites·16 claims
- 0796US5292393AMultichamber integrated process systemAPPLIED MATERIALS INC·Filed 1991·Granted Mar 8, 1994·386 cites·11 claims
- 0896US4819167ASystem and method for detecting the center of an integrated circuit waferAPPLIED MATERIALS INC·Filed 1987·Granted Apr 4, 1989·279 cites·10 claims
- 0995US5546179AMethod and apparatus for mapping the edge and other characteristics of a workpieceFiled 1994·Granted Aug 13, 1996·119 cites·17 claims
- 1094US6280581B1Method and apparatus for electroplating films on semiconductor wafersFiled 1998·Granted Aug 28, 2001·99 cites·21 claims
- 1194US5670888AMethod for transporting and testing wafersFiled 1995·Granted Sep 23, 1997·153 cites·24 claims
- 1294US5186594ADual cassette load lockAPPLIED MATERIALS INC·Filed 1990·Granted Feb 16, 1993·199 cites·3 claims
- 1393US5479108AMethod and apparatus for handling wafersCHENG DAVID·Filed 1992·Granted Dec 26, 1995·187 cites·25 claims
- 1493US5304248APassive shield for CVD wafer processing which provides frontside edge exclusion and prevents backside depositionsAPPLIED MATERIALS INC·Filed 1992·Granted Apr 19, 1994·189 cites·40 claims
- 1593US5215619AMagnetic field-enhanced plasma etch reactorAPPLIED MATERIALS INC·Filed 1991·Granted Jun 1, 1993·194 cites·25 claims
- 1692US4668338AMagnetron-enhanced plasma etching processAPPLIED MATERIALS INC·Filed 1985·Granted May 26, 1987·120 cites·14 claims
- 1791US4927485ALaser interferometer system for monitoring and controlling IC processingAPPLIED MATERIALS INC·Filed 1988·Granted May 22, 1990·83 cites·4 claims
- 1890US4911597ASemiconductor processing system with robotic autoloader and load lockAPPLIED MATERIALS INC·Filed 1987·Granted Mar 27, 1990·128 cites·23 claims
- 1988US6053688AMethod and apparatus for loading and unloading wafers from a wafer carrierFiled 1997·Granted Apr 25, 2000·98 cites·24 claims
- 2088US5691648AMethod and apparatus for measuring sheet resistance and thickness of thin films and substratesFiled 1995·Granted Nov 25, 1997·61 cites·36 claims
- 2186US5160402AMulti-channel plasma discharge endpoint detection methodAPPLIED MATERIALS INC·Filed 1990·Granted Nov 3, 1992·51 cites·12 claims
- 2285US5280983ASemiconductor processing system with robotic autoloader and load lockAPPLIED MATERIALS INC·Filed 1992·Granted Jan 25, 1994·108 cites·16 claims
- 2384US4437799APipeline transportation systemUNIV MISSOURI·Filed 1979·Granted Mar 20, 1984·36 cites·1 claims
- 2482US5769588ADual cassette load lockAPPLIED MATERIALS INC·Filed 1996·Granted Jun 23, 1998·47 cites·5 claims
- 2582US4962049AProcess for the plasma treatment of the backside of a semiconductor waferAPPLIED MATERIALS INC·Filed 1989·Granted Oct 9, 1990·56 cites·20 claims
- 2680US6454519B1Dual cassette load lockAPPLIED MATERIALS INC·Filed 1997·Granted Sep 24, 2002·42 cites·9 claims
- 2779US5452078AMethod and apparatus for finding wafer index marks and centersKOO ANN F·Filed 1993·Granted Sep 19, 1995·70 cites·20 claims
- 2878US4466087AOptical memory system for a reading/writing, verifying and tracking moduleXEROX CORP·Filed 1981·Granted Aug 14, 1984·21 cites·5 claims
- 2977US7748944B2Method and apparatus for semiconductor processingCROSSING AUTOMATION INC·Filed 2007·Granted Jul 6, 2010·7 cites·17 claims
- 3077US6249342B1Method and apparatus for handling and testing wafersFiled 1999·Granted Jun 19, 2001·50 cites·45 claims
- 3176US5914611AMethod and apparatus for measuring sheet resistance and thickness of thin films and substratesFiled 1997·Granted Jun 22, 1999·31 cites·18 claims
- 3275US4496957AOptical diskXEROX CORP·Filed 1979·Granted Jan 29, 1985·16 cites·5 claims
- 3374US5224809ASemiconductor processing system with robotic autoloader and load lockAPPLIED MATERIALS INC·Filed 1991·Granted Jul 6, 1993·60 cites·11 claims
- 3470US5708279AMethod and apparatus for measuring surface topographyKOO ANN F·Filed 1996·Granted Jan 13, 1998·27 cites·19 claims
- 3569US6154041AMethod and apparatus for measuring thickness of semiconductor substratesFiled 1999·Granted Nov 28, 2000·23 cites·3 claims
- 3661US4394667ARadial access drive for an optical disk recorderXEROX CORP·Filed 1982·Granted Jul 19, 1983·10 cites·4 claims
- 3760US5270560AMethod and apparatus for measuring workpiece surface topographyKOO ANN F·Filed 1992·Granted Dec 14, 1993·31 cites·17 claims
- 3856US6366103B1Multiple test probe systemFiled 1999·Granted Apr 2, 2002·16 cites·7 claims
- 3956US5523582AMethod and apparatus for measuring the curvature of wafers with a laser source selecting deviceKOO ANN F·Filed 1993·Granted Jun 4, 1996·23 cites·24 claims
- 4056US4130898AMotion blur compensation for moving media optical data recording systemXEROX CORP·Filed 1977·Granted Dec 19, 1978·8 cites·5 claims
- 4155US5118955AFilm stress measurement system having first and second stage meansKOO ANN·Filed 1989·Granted Jun 2, 1992·24 cites·20 claims
- 4254US5050782AMeasured volume liquid dispenser having a rotatable plunger with a radial projection for selectively engaging one of a plurality of axial channels formed in the pump cylinderWEI LINDA J·Filed 1990·Granted Sep 24, 1991·25 cites·8 claims
- 4354US2025307495A1Utilization Of Triply Periodic Minimal Surface Structures and Additive Manufacturing for Thermal Management Systems With Enhanced Thermal Properties, Mechanical Properties, and Shape ConformityLIU JIAN·Filed 2025·Application pending·0 cites
- 4452US5696383AMethod and apparatus for measuring the curvature of wafers with beams of different wavelengthsKOO ANN F·Filed 1996·Granted Dec 9, 1997·15 cites·20 claims
- 4552US2014068981A1Self-Adhering GraphicsCHENG DAVID·Filed 2012·Application pending·0 cites
- 4651US6653853B1Multiple test probe system and methodFiled 2002·Granted Nov 25, 2003·5 cites·16 claims
- 4748US6917358B2Resistance inducting wire layout on a touch panelONETOUCH TECHNOLOGIES CO LTD·Filed 2003·Granted Jul 12, 2005·2 cites·8 claims
- 4847US6788079B1Indexing multiple test probe system and methodFiled 2002·Granted Sep 7, 2004·3 cites·16 claims
- 4947US2008012358A1Sweep lockLIANG LUKE·Filed 2007·Application pending·0 cites
- 5047US2004039909A1Flexible authentication with multiple levels and factorsFiled 2002·Application pending·0 cites
Showing the top 50 of 64 patent records by PatentIndex Score.
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