Inventor · disambiguated record
Aurelien Philippe Jean Maclou Botman
Also filed as: BOTMAN AURELIEN PHILIPPE JEAN MACLOU · BOTMAN AURÉLIEN PHILIPPE JEAN MACLOU
15 granted patents·6 pending applications·20 citations·filing 2009–2024
87Inventor score
Top patents by PatentIndex Score
21 records- 0192US12061159B2Particle-induced x-ray emission (PIXE) using hydrogen and multi-species focused ion beamsFEI CO·Filed 2022·Granted Aug 13, 2024·2 cites·28 claims
- 0292US8853078B2Method of depositing materialBOTMAN AURELIEN PHILIPPE JEAN MACLOU·Filed 2011·Granted Oct 7, 2014·9 cites·26 claims
- 0378US9044781B2Microfluidics delivery systemsFEI CO·Filed 2012·Granted Jun 2, 2015·1 cites·11 claims
- 0478US8168948B2Method of machining a work piece with a focused particle beamBOTMAN AURELIEN PHILIPPE JEAN MACLOU·Filed 2009·Granted May 1, 2012·6 cites·24 claims
- 0578US2024418660A1Particle-induced x-ray emission (pixe) using hydrogen and multi-species focused ion beamsFEI CO·Filed 2024·Application pending·0 cites
- 0671US9951417B2Method of depositing materialFEI CO·Filed 2014·Granted Apr 24, 2018·0 cites·21 claims
- 0768US8872105B2In situ reactivation of fluorescence markerFEI CO·Filed 2013·Granted Oct 28, 2014·2 cites·24 claims
- 0863US9812286B2Localized, in-vacuum modification of small structuresFEI CO·Filed 2015·Granted Nov 7, 2017·0 cites·17 claims
- 0962US2025189469A1Particle-induced x-ray emission using light and heavy particle beamsFEI CO·Filed 2023·Application pending·0 cites
- 1059US2024071720A1Method and system for preparing a specimenFEI CO·Filed 2023·Application pending·0 cites
- 1157US9269530B2System for in situ reactivation of fluorescence markerFEI CO·Filed 2014·Granted Feb 23, 2016·0 cites·18 claims
- 1257US2024222068A1Condensate precursors and contaminant purge apparatus and methodsFEI CO·Filed 2022·Application pending·0 cites
- 1356US10325750B2Collision ionization sourceFEI CO·Filed 2018·Granted Jun 18, 2019·0 cites·20 claims
- 1453US9899181B1Collision ionization ion sourceFEI CO·Filed 2017·Granted Feb 20, 2018·0 cites·20 claims
- 1553US9478390B2Integrated light optics and gas delivery in a charged particle lensFEI CO·Filed 2014·Granted Oct 25, 2016·0 cites·23 claims
- 1651US9255339B2Localized, in-vacuum modification of small structuresBOTMAN AURELIEN PHILIPPE JEAN MACLOU·Filed 2011·Granted Feb 9, 2016·0 cites·16 claims
- 1748US10777383B2Method for alignment of a light beam to a charged particle beamFEI CO·Filed 2018·Granted Sep 15, 2020·0 cites·20 claims
- 1846US2017002467A1Adaptive control for charged particle beam processingFEI CO·Filed 2016·Application pending·0 cites
- 1944US2021118646A1Method for large-area 3d analysis of samples using glancing incidence fib millingFEI CO·Filed 2020·Application pending·0 cites
- 2039US10415133B2Adaptive beam current for high throughput patterningFEI CO·Filed 2016·Granted Sep 17, 2019·0 cites·16 claims
- 2136US10105734B2Method of modifying a sample surface layer from a microscopic sampleFEI CO·Filed 2016·Granted Oct 23, 2018·0 cites·13 claims
Join the waitlist — get patent alerts
Get an alert when Aurelien Philippe Jean Maclou Botman files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →