Inventor · disambiguated record
James A. O'Neill
Also filed as: O'NEILL JAMES · O'NEILL JAMES A · O'NEILL JAMES ANTHONY
25 granted patents·1,661 citations·filing 1983–2018
97Inventor score
Top patents by PatentIndex Score
25 records- 0198US5431734AAluminum oxide low pressure chemical vapor deposition (LPCVD) system-fourier transform infrared (FTIR) source chemical controlIBM·Filed 1994·Granted Jul 11, 1995·431 cites·4 claims
- 0297US5665608AMethod of aluminum oxide low pressure chemical vapor deposition (LPCVD) system-fourier transform infrared (FTIR) source chemical controlIBM·Filed 1995·Granted Sep 9, 1997·478 cites·4 claims
- 0396US5200023AInfrared thermographic method and apparatus for etch process monitoring and controlIBM·Filed 1991·Granted Apr 6, 1993·181 cites·32 claims
- 0492US5308414AMethod and apparatus for optical emission end point detection in plasma etching processesIBM·Filed 1992·Granted May 3, 1994·79 cites·16 claims
- 0588US4622115APhotochemical process using a waveguide reaction cellONEILL JAMES A·Filed 1985·Granted Nov 11, 1986·57 cites·4 claims
- 0685US5683538AControl of etch selectivityIBM·Filed 1994·Granted Nov 4, 1997·85 cites·8 claims
- 0783US5738440ACombined emissivity and radiance measurement for the determination of the temperature of a radiant objectIBM·Filed 1994·Granted Apr 14, 1998·52 cites·6 claims
- 0881US5770097AControl of etch selectivityIBM·Filed 1997·Granted Jun 23, 1998·56 cites·5 claims
- 0978US10475575B2In-situ oxidized NiO as electrode surface for high k MIM deviceENTEGRIS INC·Filed 2013·Granted Nov 12, 2019·1 cites·14 claims
- 1076US5993059ACombined emissivity and radiance measurement for determination of temperature of radiant objectIBM·Filed 1998·Granted Nov 30, 1999·43 cites·14 claims
- 1169US5648113AAluminum oxide LPCVD systemIBM·Filed 1994·Granted Jul 15, 1997·25 cites·12 claims
- 1268US5332441AApparatus for gettering of particles during plasma processingIBM·Filed 1991·Granted Jul 26, 1994·17 cites·10 claims
- 1366US5793075ADeep trench cell capacitor with inverting counter electrodeIBM·Filed 1996·Granted Aug 11, 1998·18 cites·29 claims
- 1466US5433258AGettering of particles during plasma processingIBM·Filed 1994·Granted Jul 18, 1995·15 cites·9 claims
- 1565US11479954B2Solid waste interceptor for a drainENVIRONMENTAL PRODUCTS & SERVICES LTD·Filed 2018·Granted Oct 25, 2022·3 cites·12 claims
- 1663US5284549ASelective fluorocarbon-based RIE process utilizing a nitrogen additiveIBM·Filed 1992·Granted Feb 8, 1994·36 cites·6 claims
- 1760US9205352B2Apparatus for treating waste waterO'NEILL JAMES·Filed 2012·Granted Dec 8, 2015·3 cites·15 claims
- 1856US5540777AAluminum oxide LPCVD systemIBM·Filed 1995·Granted Jul 30, 1996·17 cites·7 claims
- 1954US6265278B1Deep trench cell capacitor with inverting counter electrodeIBM·Filed 1998·Granted Jul 24, 2001·10 cites·18 claims
- 2051US5534066AFluid delivery apparatus having an infrared feedline sensorIBM·Filed 1993·Granted Jul 9, 1996·14 cites·15 claims
- 2149US5492718AFluid delivery apparatus and method having an infrared feedline sensorIBM·Filed 1994·Granted Feb 20, 1996·11 cites·16 claims
- 2249US5193298AFishing rod apparatusONEILL JAMES A·Filed 1992·Granted Mar 16, 1993·16 cites·2 claims
- 2347US6518145B1Methods to control the threshold voltage of a deep trench corner deviceIBM·Filed 1998·Granted Feb 11, 2003·10 cites·10 claims
- 2428US4746493AWaveguide reaction cellONEILL JAMES A·Filed 1986·Granted May 24, 1988·0 cites·5 claims
- 2519US4620909AMethod for isotope replenishment in an exchange liquid used in a laser induced isotope enrichment processKEYSER GRAHAM M·Filed 1983·Granted Nov 4, 1986·3 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →