Inventor · disambiguated record
Sheng-Feng Lu
Also filed as: LU SHENG-FENG
6 granted patents·3 pending applications·21 citations·filing 2006–2015
78Inventor score
Top patents by PatentIndex Score
9 records- 0182US7414423B2Wafer-level test module for testing image sensor chips, the related test method and fabricationVISERA TECHNOLOGIES CO LTD·Filed 2007·Granted Aug 19, 2008·9 cites·13 claims
- 0272US7915903B2Batch-test method using a chip trayVISERA TECHNOLOGIES CO LTD·Filed 2009·Granted Mar 29, 2011·5 cites·16 claims
- 0369US7595631B2Wafer level assemble chip multi-site testing solutionVISERA TECHNOLOGIES CO LTD·Filed 2007·Granted Sep 29, 2009·4 cites·16 claims
- 0465US7589033B2Fabrication of wafer-level test module for testing image sensor chipsVISERA TECHNOLOGIES CO LTD·Filed 2008·Granted Sep 15, 2009·2 cites·5 claims
- 0549US7576551B2Test socket and test board for wafer level semiconductor testingVISERA TECHNOLOGIES CO LTD·Filed 2007·Granted Aug 18, 2009·1 cites·14 claims
- 0646US2009032681A1Detector and detecting methodVISERA TECHNOLOGIES CO LTD·Filed 2007·Application pending·0 cites
- 0740US9601424B2Interposer and methods of forming and testing an interposerGLOBALFOUNDRIES INC·Filed 2015·Granted Mar 21, 2017·0 cites·14 claims
- 0838US2007151896A1Packing member for packing wafer containerVISERA TECHNOLOGIES CO LTD·Filed 2006·Application pending·0 cites
- 0934US2008122469A1Probe card for testing image-sensing chipsVISERA TECHNOLOGIES CO LTD·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Sheng-Feng Lu files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →