Inventor · disambiguated record
Ibrahim Abdul-Halim
Also filed as: ABDUL-HALIM IBRAHIM
2 granted patents·2 pending applications·167 citations·filing 2003–2013
71Inventor score
Technology areasH10P
Top patents by PatentIndex Score
4 records- 0197US8179530B2Methods and systems for determining a critical dimension and overlay of a specimenLEVY ADY·Filed 2010·Granted May 15, 2012·143 cites·24 claims
- 0295US8502979B2Methods and systems for determining a critical dimension and overlay of a specimenLEVY ADY·Filed 2012·Granted Aug 6, 2013·24 cites·8 claims
- 0357US2013314710A1Methods and Systems for Determining a Critical Dimension and Overlay of a SpecimenKLA TENCOR TECH CORP·Filed 2013·Application pending·0 cites
- 0440US2004005507A1Methods and systems for lithography process controlKLA TENCOR INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →