Inventor · disambiguated record
Dai Fujii
Also filed as: FUJII DAI
10 granted patents·4 pending applications·64 citations·filing 1999–2012
89Inventor score
Top patents by PatentIndex Score
14 records- 0180US8036447B2Inspection apparatus for inspecting patterns of a substrateHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 11, 2011·10 cites·3 claims
- 0267US6708069B2Distributed control system and filtering method used in the distributed control systemHITACHI LTD·Filed 2002·Granted Mar 16, 2004·8 cites·2 claims
- 0364US6986029B2Micro-controller for reading out compressed instruction code and program memory for compressing instruction code and storing thereinHITACHI LTD·Filed 2002·Granted Jan 10, 2006·8 cites·8 claims
- 0461US6915413B2Micro-controller for reading out compressed instruction code and program memory for compressing instruction code and storing thereinHITACHI LTD·Filed 2002·Granted Jul 5, 2005·6 cites·13 claims
- 0560US6996130B2Distributed control system and filtering method used in the distributed control systemHITACHI LTD·Filed 2002·Granted Feb 7, 2006·4 cites·2 claims
- 0657US6609232B2Logic compound method and logic compound apparatusHITACHI LTD·Filed 2001·Granted Aug 19, 2003·6 cites·6 claims
- 0755US7421110B2Image processing unit for wafer inspection toolHITACHI HIGH TECH CORP·Filed 2004·Granted Sep 2, 2008·6 cites·8 claims
- 0853US7889911B2Image processing unit for wafer inspection toolHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 15, 2011·1 cites·8 claims
- 0953US6957109B2Distributed control system and filtering method used in the distributed control systemHITACHI LTD·Filed 2003·Granted Oct 18, 2005·1 cites·3 claims
- 1048US2005198471A1Micro-controller for reading out compressed instruction code and program memory for compressing instruction code and storing thereinHITACHI LTD·Filed 2005·Application pending·0 cites
- 1146US6681139B1Distributed control system and filtering method used in the distributed control systemHITACHI LTD·Filed 1999·Granted Jan 20, 2004·14 cites·21 claims
- 1244US2006171593A1Inspection apparatus for inspecting patterns of a substrateHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 1341US2002174272A1DMA controller and automatic DMA controller generating apparatusFiled 2001·Application pending·0 cites
- 1437US2013050469A1Defect Inspection ApparatusTAKEZAWA MASAYUKI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →