Inventor · disambiguated record
Michael Friedmann
Also filed as: FRIEDMANN MICHAEL · FRIEDMANN MICHAEL JONATHAN
43 granted patents·10 pending applications·863 citations·filing 2001–2025
98Inventor score
Top patents by PatentIndex Score
53 records- 0199US7797019B2Shared image database with geographic navigationRESEARCH IN MOTION LTD·Filed 2006·Granted Sep 14, 2010·140 cites·12 claims
- 0297US9476698B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2015·Granted Oct 25, 2016·22 cites·13 claims
- 0397US7656528B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2007·Granted Feb 2, 2010·60 cites·21 claims
- 0497US7433040B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2007·Granted Oct 7, 2008·28 cites·18 claims
- 0597US7317531B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2003·Granted Jan 8, 2008·83 cites·30 claims
- 0697US7242477B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Jul 10, 2007·124 cites·20 claims
- 0796US10599712B2Shared image database with geographic navigationBLACKBERRY LTD·Filed 2019·Granted Mar 24, 2020·8 cites·19 claims
- 0896US7564557B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2007·Granted Jul 21, 2009·19 cites·7 claims
- 0996US7298481B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Nov 20, 2007·46 cites·11 claims
- 1096US7289213B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Oct 30, 2007·49 cites·15 claims
- 1196US7280212B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Oct 9, 2007·45 cites·12 claims
- 1295US7933016B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2009·Granted Apr 26, 2011·15 cites·20 claims
- 1395US7876440B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2009·Granted Jan 25, 2011·13 cites·18 claims
- 1495US7663753B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2007·Granted Feb 16, 2010·19 cites·45 claims
- 1595US7277172B2Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signalsKLA TENCOR TECH CORP·Filed 2006·Granted Oct 2, 2007·34 cites·27 claims
- 1694US11333621B2Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffractionKLA TENCOR CORP·Filed 2018·Granted May 17, 2022·10 cites·27 claims
- 1794US10451412B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR CORP·Filed 2017·Granted Oct 22, 2019·7 cites·14 claims
- 1894US7385699B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Jun 10, 2008·34 cites·33 claims
- 1994US7301634B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted Nov 27, 2007·35 cites·33 claims
- 2093US8525994B2Periodic patterns and technique to control misaligment between two layersABDULHALIM IBRAHIM·Filed 2009·Granted Sep 3, 2013·12 cites·8 claims
- 2192US7953422B2Shared image database with geographic navigationRESEARCH IN MOTION·Filed 2010·Granted May 31, 2011·11 cites·12 claims
- 2291US10859518B2X-ray zoom lens for small angle x-ray scatterometryKLA TENCOR CORP·Filed 2017·Granted Dec 8, 2020·5 cites·25 claims
- 2388US10365211B2Systems and methods for metrology beam stabilizationKLA TENCOR CORP·Filed 2018·Granted Jul 30, 2019·6 cites·21 claims
- 2488US8107975B2Shared image database with geographic navigationFRIEDMANN MICHAEL JONATHAN·Filed 2011·Granted Jan 31, 2012·8 cites·12 claims
- 2588US7379183B2Apparatus and methods for detecting overlay errors using scatterometryKLA TENCOR TECH CORP·Filed 2004·Granted May 27, 2008·18 cites·44 claims
- 2687US8570515B2Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2009·Granted Oct 29, 2013·5 cites·61 claims
- 2781US10663392B2Variable aperture maskKLA TENCOR CORP·Filed 2018·Granted May 26, 2020·1 cites·10 claims
- 2878US11121521B2System and method for pumping laser sustained plasma with interlaced pulsed illumination sourcesKLA CORP·Filed 2020·Granted Sep 14, 2021·1 cites·34 claims
- 2971US8793248B2Method and system for recommending Geo-tagged itemsFRIEDMANN MICHAEL·Filed 2012·Granted Jul 29, 2014·5 cites·16 claims
- 3069US10151584B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2017·Granted Dec 11, 2018·0 cites·9 claims
- 3168US11268901B2Variable aperture maskKLA CORP·Filed 2020·Granted Mar 8, 2022·0 cites·11 claims
- 3265US10235390B2Shared image database with geographic navigationBLACKBERRY LTD·Filed 2016·Granted Mar 19, 2019·0 cites·19 claims
- 3365US9835447B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2016·Granted Dec 5, 2017·0 cites·10 claims
- 3463US9234745B2Periodic patterns and techniques to control misalignment between two layersKLA TENCOR CORP·Filed 2015·Granted Jan 12, 2016·0 cites·12 claims
- 3563US9104696B2Shared image database with geographic navigationBLACKBERRY LTD·Filed 2013·Granted Aug 11, 2015·0 cites·21 claims
- 3663US9103662B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2013·Granted Aug 11, 2015·0 cites·3 claims
- 3763US2025377524A1Novel illumination and background rejection for enhanced resolution imagingULTIMA GENOMICS INC·Filed 2025·Application pending·0 cites
- 3861US9552426B2Shared image database with geographic navigationBLACKBERRY LTD·Filed 2015·Granted Jan 24, 2017·0 cites·15 claims
- 3959US2025283169A1Enhanced resolution imagingULTIMA GENOMICS INC·Filed 2025·Application pending·0 cites
- 4056US2006262326A1Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2006·Application pending·0 cites
- 4155US8472981B2Shared image database with geographic navigationFRIEDMANN MICHAEL JONATHAN·Filed 2012·Granted Jun 25, 2013·0 cites·20 claims
- 4255US2006065625A1Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2005·Application pending·0 cites
- 4355US2006132807A1Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2006·Application pending·0 cites
- 4454US2005208685A1Periodic patterns and technique to control misalignmentABDULHALIM IBRAHIM·Filed 2005·Application pending·0 cites
- 4554US2005157297A1Periodic patterns and technique to control misalignment between two layersFiled 2005·Application pending·0 cites
- 4653US11557462B2Collecting and recycling rare gases in semiconductor processing equipmentKLA CORP·Filed 2020·Granted Jan 17, 2023·0 cites·20 claims
- 4752US12013355B2Methods and systems for compact, small spot size soft x-ray scatterometryKLA CORP·Filed 2021·Granted Jun 18, 2024·0 cites·31 claims
- 4848US11259394B2Laser produced plasma illuminator with liquid sheet jet targetKLA CORP·Filed 2020·Granted Feb 22, 2022·0 cites·23 claims
- 4945US2004061857A1Periodic patterns and technique to control misalignment between two layersFiled 2003·Application pending·0 cites
- 5045US2004229471A1Periodic patterns and technique to control misalignment between two layersFiled 2003·Application pending·0 cites
Showing the top 50 of 53 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →