Inventor · disambiguated record
Tetsu Kawasaki
Also filed as: KAWASAKI TETSU
17 granted patents·6 pending applications·233 citations·filing 1997–2023
92Inventor score
Top patents by PatentIndex Score
23 records- 0183US5853812AMethod and apparatus for processing substratesTOKYO ELECTRON LTD·Filed 1997·Granted Dec 29, 1998·40 cites·14 claims
- 0282US6010570AApparatus for forming coating film for semiconductor processingTOKYO ELECTRON LTD·Filed 1997·Granted Jan 4, 2000·67 cites·24 claims
- 0378US8037890B2Substrate cleaning device and substrate cleaning methodTOKYO ELECTRON LTD·Filed 2006·Granted Oct 18, 2011·5 cites·6 claims
- 0475US10721369B2Image forming apparatus performing image quality adjustment for foil stampingKONICA MINOLTA INC·Filed 2017·Granted Jul 21, 2020·1 cites·20 claims
- 0574US12155795B2Image inspection apparatus, image inspection method, and non-transitory computer-readable medium used for image inspection which sets and displays an area from inspectionKONICA MINOLTA INC·Filed 2023·Granted Nov 26, 2024·0 cites·16 claims
- 0674US5906860AApparatus for treating a substrate with resist and resist-treating methodTOKYO ELECTRON LTD·Filed 1997·Granted May 25, 1999·49 cites·27 claims
- 0771US6660124B1Polishing system and polishing methodTOKYO ELECTRON LTD·Filed 2000·Granted Dec 9, 2003·14 cites·7 claims
- 0869US12248265B2Image forming apparatus, cost calculation method, and recording mediumKONICA MINOLTA INC·Filed 2023·Granted Mar 11, 2025·0 cites·12 claims
- 0967US11722604B2Image inspection apparatus, image inspection method, and non-transitory computer-readable medium for indicating areas to be inspected and areas exempt from inspectionKONICA MINOLTA INC·Filed 2022·Granted Aug 8, 2023·0 cites·25 claims
- 1067US6238511B1Method and apparatus for processing substrateTOKYO ELECTRON LTD·Filed 1998·Granted May 29, 2001·34 cites·11 claims
- 1161US11375067B2Image inspection apparatus, image inspection method, and non-transitory computer-readable medium for indicating areas to be inspected and areas exempt from inspectionKONICA MINOLTA INC·Filed 2020·Granted Jun 28, 2022·0 cites·22 claims
- 1258US6110282ACoating apparatus for semiconductor processTOKYO ELECTRON LTD·Filed 1997·Granted Aug 29, 2000·23 cites·23 claims
- 1353US10523825B2Image forming apparatus, image inspection apparatus, and programKONICA MINOLTA INC·Filed 2019·Granted Dec 31, 2019·0 cites·15 claims
- 1453US2023409252A1Image forming system and image forming methodKONICA MINOLTA INC·Filed 2023·Application pending·0 cites
- 1547US2012006362A1Substrate cleaning device and substrate cleaning methodYAMAMOTO TARO·Filed 2011·Application pending·0 cites
- 1646US10334121B2Image forming apparatusKONICA MINOLTA INC·Filed 2017·Granted Jun 25, 2019·0 cites·9 claims
- 1746US2014132985A1Image forming apparatusKONICA MINOLTA INC·Filed 2013·Application pending·0 cites
- 1845US2008070167A1Exposure and developing methodTOKYO ELECTRON LTD·Filed 2007·Application pending·0 cites
- 1944US8202682B2Method of manufacturing semiconductor device, and resist coating and developing systemIWAO FUMIKO·Filed 2009·Granted Jun 19, 2012·0 cites·16 claims
- 2043US2021402757A1Image processing apparatus, image forming apparatus and computer readable storage mediumKONICA MINOLTA INC·Filed 2021·Application pending·0 cites
- 2142US9365380B2Image formation apparatus that laterally shifts a continuous webKONICA MINOLTA INC·Filed 2015·Granted Jun 14, 2016·0 cites·12 claims
- 2242US7485568B2Method for forming wiring of semiconductor deviceTOKYO ELECTRON LTD·Filed 2005·Granted Feb 3, 2009·0 cites·3 claims
- 2340US2007184379A1Peeling-off method and reworking method of resist filmTOKYO ELECTRON LTD·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →