Inventor · disambiguated record
Minoru Akutsu
Also filed as: AKUTSU MINORU
23 granted patents·5 pending applications·80 citations·filing 2005–2025
93Inventor score
Top patents by PatentIndex Score
28 records- 0197US9837521B2Nitride semiconductor device and fabrication method thereforROHM CO LTD·Filed 2013·Granted Dec 5, 2017·29 cites·39 claims
- 0292US10256335B2Nitride semiconductor device and fabrication method thereforROHM CO LTD·Filed 2017·Granted Apr 9, 2019·4 cites·32 claims
- 0391US2025324647A1Nitride semiconductor device and fabrication method thereforROHM CO LTD·Filed 2025·Application pending·0 cites
- 0490US8179747B1Thermally assisted magnetic headMUGINO YOICHI·Filed 2011·Granted May 15, 2012·29 cites·8 claims
- 0587US12369346B2Nitride semiconductor device and fabrication method thereforROHM CO LTD·Filed 2023·Granted Jul 22, 2025·0 cites·29 claims
- 0683US9293573B2Nitride semiconductor device and manufacturing method thereofROHM CO LTD·Filed 2013·Granted Mar 22, 2016·7 cites·19 claims
- 0782US10038070B2Nitride semiconductor deviceROHM CO LTD·Filed 2016·Granted Jul 31, 2018·4 cites·25 claims
- 0881US10340360B2Nitride semiconductor device and method for manufacturing the sameROHM CO LTD·Filed 2018·Granted Jul 2, 2019·2 cites·16 claims
- 0980US9905669B2Nitride semiconductor device and method for manufacturing the sameROHM CO LTD·Filed 2016·Granted Feb 27, 2018·2 cites·13 claims
- 1079US2025096110A1Semiconductor device and method for producing sameROHM CO LTD·Filed 2024·Application pending·0 cites
- 1177US12199028B2Semiconductor device and method for producing sameROHM CO LTD·Filed 2023·Granted Jan 14, 2025·0 cites·21 claims
- 1277US11777024B2Nitride semiconductor device and fabrication method thereforROHM CO LTD·Filed 2021·Granted Oct 3, 2023·0 cites·31 claims
- 1377US10804384B2Semiconductor device and manufacturing method thereofROHM CO LTD·Filed 2018·Granted Oct 13, 2020·2 cites·20 claims
- 1474US10991818B2Nitride semiconductor device and fabrication method thereforROHM CO LTD·Filed 2020·Granted Apr 27, 2021·0 cites·16 claims
- 1567US10686064B2Nitride semiconductor device and fabrication method thereforROHM CO LTD·Filed 2019·Granted Jun 16, 2020·0 cites·20 claims
- 1664US9704982B2Semiconductor device with high electron mobility transistor (HEMT) having source field plateROHM CO LTD·Filed 2016·Granted Jul 11, 2017·1 cites·16 claims
- 1762US10727312B2Nitride semiconductor device and method for manufacturing the sameROHM CO LTD·Filed 2019·Granted Jul 28, 2020·0 cites·8 claims
- 1858US9564739B2Semiconductor laser deviceROHM CO LTD·Filed 2016·Granted Feb 7, 2017·0 cites·20 claims
- 1957US11694954B2Semiconductor device and method for producing sameROHM CO LTD·Filed 2018·Granted Jul 4, 2023·0 cites·10 claims
- 2057US2025216410A1Measurement system and measurement methodYOKOGAWA ELECTRIC CORP·Filed 2023·Application pending·0 cites
- 2156US9356432B2Semiconductor laser deviceROHM CO LTD·Filed 2014·Granted May 31, 2016·0 cites·23 claims
- 2254US12165957B2Semiconductor deviceROHM CO LTD·Filed 2020·Granted Dec 10, 2024·0 cites·18 claims
- 2349US8699536B2Semiconductor laser deviceNOMA TSUGUKI·Filed 2011·Granted Apr 15, 2014·0 cites·9 claims
- 2449US2021376136A1Nitride semiconductor deviceROHM CO LTD·Filed 2021·Application pending·0 cites
- 2546US12272742B2Nitride semiconductor deviceROHM CO LTD·Filed 2020·Granted Apr 8, 2025·0 cites·20 claims
- 2642US8823819B2Apparatus for measuring position and shape of pattern formed on sheetICHIZAWA YASUSHI·Filed 2011·Granted Sep 2, 2014·0 cites·4 claims
- 2738US7243033B2Inspection apparatusYOKOGAWA ELECTRIC CORP·Filed 2005·Granted Jul 10, 2007·0 cites·17 claims
- 2837US2011273557A1Position measuring systemYOKOGAWA ELECTRIC CORP·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →