Assignee
ICHIZAWA YASUSHI
JP·5 granted patents·1 pending application·33 citations·filing 2010–2012
Top patents by PatentIndex Score
6 records- 0187US8447012B2Radiation inspection apparatusICHIZAWA YASUSHI·Filed 2010·Granted May 21, 2013·12 cites·17 claims
- 0283US8483355B2Radiation inspection apparatus comprising a gas ejecting unit for supporting and conveying a sheet-like sampleICHIZAWA YASUSHI·Filed 2010·Granted Jul 9, 2013·7 cites·4 claims
- 0382US8829459B2Radiation detection apparatusICHIZAWA YASUSHI·Filed 2010·Granted Sep 9, 2014·9 cites·9 claims
- 0474US8488744B2X-ray measurement apparatusICHIZAWA YASUSHI·Filed 2010·Granted Jul 16, 2013·5 cites·16 claims
- 0542US8823819B2Apparatus for measuring position and shape of pattern formed on sheetICHIZAWA YASUSHI·Filed 2011·Granted Sep 2, 2014·0 cites·4 claims
- 0634US2012218542A1Infrared analysis apparatusICHIZAWA YASUSHI·Filed 2012·Application pending·0 cites
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