Inventor · disambiguated record
Helmut Fischer
Also filed as: FISCHER HELMUT
129 granted patents·9 pending applications·1,383 citations·filing 1976–2021
99Inventor score
Files withINFINEON TECHNOLOGIES AG46FISCHER HELMUT33SIEMENS AG10IMMOBILIENGES HELMUT FISCHER7DAIMLER BENZ AG4
Top patents by PatentIndex Score
138 records- 0198US6530872B2Free jet centrifuge rotorMANN & HUMMEL FILTER·Filed 2002·Granted Mar 11, 2003·141 cites·12 claims
- 0297US11867666B2Measuring system, measuring arrangement and method for determining measuring signals during a penetration movement of a penetration body into a surface of a test bodyHELMUT FISCHER GMBH INST FUER ELEKTRONIK UND MESSTECHNIK·Filed 2021·Granted Jan 9, 2024·3 cites·20 claims
- 0396US4829251AElectromagnetic probe for measuring the thickness of thin coatings on magnetic substratesFISCHER HELMUT·Filed 1983·Granted May 9, 1989·68 cites·12 claims
- 0490US4799246AApparatus for measuring the thickness of thin layersFISCHER HELMUT·Filed 1986·Granted Jan 17, 1989·50 cites·5 claims
- 0589US5923053ALight-emitting diode having a curved side surface for coupling out lightSIEMENS AG·Filed 1996·Granted Jul 13, 1999·81 cites·6 claims
- 0687US6025251AMethod for producing a plurality of semiconductor componentsSIEMENS AG·Filed 1999·Granted Feb 15, 2000·71 cites·2 claims
- 0786US6224531B1Rotor for a free jet centrifuge having an internal guiding elementMANN & HUMMEL FILTER·Filed 1998·Granted May 1, 2001·65 cites·13 claims
- 0885US8745889B2Measurement stand and method of its electrical controlFISCHER HELMUT·Filed 2010·Granted Jun 10, 2014·8 cites·20 claims
- 0985US6118844AMethod and device for the determination of measurement uncertainties in X-ray fluorescence layer thicknessHELMUT FISCHER GMBH & CO·Filed 1998·Granted Sep 12, 2000·60 cites·21 claims
- 1080USD367821SCoating thickness gaugeFISCHER HELMUT·Filed 1994·Granted Mar 12, 1996·17 cites·1 claims
- 1179US9857171B2Measuring probe for non-destructive measuring of the thickness of thin layersFISCHER HELMUT·Filed 2011·Granted Jan 2, 2018·5 cites·21 claims
- 1278US6531405B1Process for producing a light-emitting and/or a light-receiving semiconductor bodySIEMENS AG·Filed 1999·Granted Mar 11, 2003·53 cites·13 claims
- 1377US4597093AApparatus for measuring the thickness of thin layersFISCHER HELMUT·Filed 1983·Granted Jun 24, 1986·22 cites·33 claims
- 1476US9772205B2Method for electronically activating a measurement stand, and measurement stand for supporting a measuring probeHELMUT FISCHER GMBH INST FUR ELEKTRONIK UND MESSTECHNIK·Filed 2015·Granted Sep 26, 2017·2 cites·28 claims
- 1576US9041020B2Electrolytically coated optoelectronic semiconductor component and method for producing an optoelectronic semiconductor componentHERRMANN SIEGFRIED·Filed 2011·Granted May 26, 2015·3 cites·15 claims
- 1676US7610690B2Measurement stand for holding a measuring instrumentIMMOBILIENGES HELMUT FISCHER·Filed 2006·Granted Nov 3, 2009·9 cites·23 claims
- 1776US4848509ACentral locking system for door and lid fastenings of a motor vehicleDAIMLER BENZ AG·Filed 1988·Granted Jul 18, 1989·33 cites·9 claims
- 1875US7472491B2Measuring probe, especially for a device for the measurement of the thickness of thin layersIMMOBILIENGES HELMUT FISCHER·Filed 2006·Granted Jan 6, 2009·8 cites·20 claims
- 1973US7906352B2Chip and method for producing a chipOSRAM OPTO SEMICONDUCTORS GMBH·Filed 2006·Granted Mar 15, 2011·5 cites·26 claims
- 2073US6309953B1Process for producing a semiconductor device with a roughened semiconductor surfaceSIEMENS AG·Filed 2000·Granted Oct 30, 2001·19 cites·4 claims
- 2173US5191286AMethod and probe for non-destructive measurement of the thickness of thin layers and coatingsFISCHER HELMUT·Filed 1991·Granted Mar 2, 1993·31 cites·22 claims
- 2271US4736118ACircuit arrangement to generate squarewave signals with constant duty cycleSIEMENS AG·Filed 1986·Granted Apr 5, 1988·28 cites·4 claims
- 2371US4691559ADevice for measuring the properties of solid materials which can be derived from the behavior of a penetrating bodyFISCHER HELMUT·Filed 1985·Granted Sep 8, 1987·30 cites·45 claims
- 2470US7330053B2Prestage for an off-chip driver (OCD)INFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 12, 2008·8 cites·11 claims
- 2570US6824657B1Component supportHELMUT FISCHER GMBH & CO·Filed 2000·Granted Nov 30, 2004·6 cites·42 claims
- 2670US6457868B1Shaft bearing with spherical collar for the shaftMANN & HUMMEL FILTER·Filed 2001·Granted Oct 1, 2002·10 cites·8 claims
- 2769US4671104ADevice for measuring the properties of solid materials which can be derived from the behaviour of a penetrating bodyFISCHER HELMUT·Filed 1984·Granted Jun 9, 1987·22 cites·22 claims
- 2869US4562768AAlternative ammunition belt feeder for an automatic machine cannonRHEINMETALL GMBH·Filed 1984·Granted Jan 7, 1986·24 cites·16 claims
- 2968US7317603B2Integrated circuit with electrostatic discharge protectionINFINEON TECHNOLOGIES AG·Filed 2006·Granted Jan 8, 2008·4 cites·12 claims
- 3067US6777930B2Sequentially non-destructive thickness measurementHELMUT FISCHER GMBH & CO·Filed 2001·Granted Aug 17, 2004·13 cites·23 claims
- 3166US7448250B2Calibration standardIMMOBILIENGES HELMUT FISCHER·Filed 2006·Granted Nov 11, 2008·1 cites·20 claims
- 3265US6928024B2RAM memory circuit and method for memory operation at a multiplied data rateINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 9, 2005·14 cites·10 claims
- 3364US9076897B2Optoelectronic semiconductor device and method for producing an optoelectronic semiconductor deviceFISCHER HELMUT·Filed 2012·Granted Jul 7, 2015·1 cites·15 claims
- 3462US6768139B2Transistor configuration for a bandgap circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jul 27, 2004·10 cites·6 claims
- 3561US8474151B2Method and device for measuring the thickness of thin layers over large-area surfaces to be measuredFISCHER HELMUT·Filed 2011·Granted Jul 2, 2013·1 cites·16 claims
- 3660US8560269B2Method for outputting measured values and display deviceFISCHER HELMUT·Filed 2005·Granted Oct 15, 2013·2 cites·12 claims
- 3760US7690243B2Method and apparatus for measurement of the thickness of thin layers by means of measurement probeIMMOBILIENGES HELMUT FISCHER·Filed 2007·Granted Apr 6, 2010·3 cites·10 claims
- 3860US4899612ACover sleeve arrangement for a vehicle steering columnDAIMLER BENZ AG·Filed 1988·Granted Feb 13, 1990·20 cites·12 claims
- 3960US4618825AElectro-magnetic thickness measuring probeFISCHER HELMUT·Filed 1984·Granted Oct 21, 1986·14 cites·19 claims
- 4060US2021116344A1Measuring system, measuring arrangement and method for determining measuring signals during a penetration movement of a penetration body into a surface of a test bodyHELMUT FISCHER GMBH INST FUER ELEKTRONIK UND MESSTECHNIK·Filed 2017·Application pending·0 cites
- 4159US6788606B2Method and apparatus for refreshing memory cellsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 7, 2004·11 cites·6 claims
- 4259US6140248AProcess for producing a semiconductor device with a roughened semiconductor surfaceSIEMENS AG·Filed 1997·Granted Oct 31, 2000·19 cites·4 claims
- 4358US6787801B2Wafer with additional circuit parts in the kerf area for testing integrated circuits on the waferINFIENON TECHNOLOGIES AG·Filed 2002·Granted Sep 7, 2004·7 cites·7 claims
- 4458US6636453B2Memory circuit having a plurality of memory areasINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 21, 2003·10 cites·6 claims
- 4558US6545930B2Integrated memory having a voltage regulating circuitINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 8, 2003·10 cites·10 claims
- 4658US4433265ACooled discharge lamp having a fluid cooled diaphragm structureORIGINAL HANAU HERAEUS GMBH·Filed 1980·Granted Feb 21, 1984·9 cites·16 claims
- 4757USD437795SMeasuring apparatusFISCHER HELMUT·Filed 1994·Granted Feb 20, 2001·7 cites·1 claims
- 4856US4025169AHigh speed wide angle objective lens systemZEISS STIFTUNG·Filed 1976·Granted May 24, 1977·15 cites·25 claims
- 4955US7323936B2Input circuit for receiving an input signal, and a method for adjusting an operating point of an input circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 29, 2008·3 cites·24 claims
- 5055US4840110ADevice for storing and loading ammunition in a turretRHEINMETALL GMBH·Filed 1988·Granted Jun 20, 1989·14 cites·5 claims
Showing the top 50 of 138 patent records by PatentIndex Score.
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