Assignee
FISCHER HELMUT
DE·33 granted patents·1 pending application·398 citations·filing 1979–2012
Top patents by PatentIndex Score
34 records- 0196US4829251AElectromagnetic probe for measuring the thickness of thin coatings on magnetic substratesFISCHER HELMUT·Filed 1983·Granted May 9, 1989·68 cites·12 claims
- 0290US4799246AApparatus for measuring the thickness of thin layersFISCHER HELMUT·Filed 1986·Granted Jan 17, 1989·50 cites·5 claims
- 0385US8745889B2Measurement stand and method of its electrical controlFISCHER HELMUT·Filed 2010·Granted Jun 10, 2014·8 cites·20 claims
- 0480USD367821SCoating thickness gaugeFISCHER HELMUT·Filed 1994·Granted Mar 12, 1996·17 cites·1 claims
- 0579US9857171B2Measuring probe for non-destructive measuring of the thickness of thin layersFISCHER HELMUT·Filed 2011·Granted Jan 2, 2018·5 cites·21 claims
- 0677US4597093AApparatus for measuring the thickness of thin layersFISCHER HELMUT·Filed 1983·Granted Jun 24, 1986·22 cites·33 claims
- 0773US5191286AMethod and probe for non-destructive measurement of the thickness of thin layers and coatingsFISCHER HELMUT·Filed 1991·Granted Mar 2, 1993·31 cites·22 claims
- 0871US4691559ADevice for measuring the properties of solid materials which can be derived from the behavior of a penetrating bodyFISCHER HELMUT·Filed 1985·Granted Sep 8, 1987·30 cites·45 claims
- 0969US4671104ADevice for measuring the properties of solid materials which can be derived from the behaviour of a penetrating bodyFISCHER HELMUT·Filed 1984·Granted Jun 9, 1987·22 cites·22 claims
- 1064US9076897B2Optoelectronic semiconductor device and method for producing an optoelectronic semiconductor deviceFISCHER HELMUT·Filed 2012·Granted Jul 7, 2015·1 cites·15 claims
- 1161US8474151B2Method and device for measuring the thickness of thin layers over large-area surfaces to be measuredFISCHER HELMUT·Filed 2011·Granted Jul 2, 2013·1 cites·16 claims
- 1260US8560269B2Method for outputting measured values and display deviceFISCHER HELMUT·Filed 2005·Granted Oct 15, 2013·2 cites·12 claims
- 1360US4618825AElectro-magnetic thickness measuring probeFISCHER HELMUT·Filed 1984·Granted Oct 21, 1986·14 cites·19 claims
- 1457USD437795SMeasuring apparatusFISCHER HELMUT·Filed 1994·Granted Feb 20, 2001·7 cites·1 claims
- 1553US5642004APower supply for standby circuits of electrical devicesFISCHER HELMUT·Filed 1994·Granted Jun 24, 1997·30 cites·10 claims
- 1652US9605940B2Measuring probe for measuring the thickness of thin layers, and method for the production of a sensor element for the measuring probeFISCHER HELMUT·Filed 2012·Granted Mar 28, 2017·0 cites·20 claims
- 1751US9435629B2Measuring probe with shielding element for measuring the thickness of thin layersFISCHER HELMUT·Filed 2012·Granted Sep 6, 2016·0 cites·17 claims
- 1851US7784325B2Calibration standardFISCHER HELMUT·Filed 2006·Granted Aug 31, 2010·1 cites·12 claims
- 1950US9074880B2Measuring probe for non-destructive measuring of the thickness of thin layersFISCHER HELMUT·Filed 2011·Granted Jul 7, 2015·0 cites·24 claims
- 2050USD330518SCoating thickness gaugeFISCHER HELMUT·Filed 1990·Granted Oct 27, 1992·6 cites·1 claims
- 2148US4841764ADevice for a hardness measuring instrumentFISCHER HELMUT·Filed 1988·Granted Jun 27, 1989·11 cites·18 claims
- 2246US5309495APositioning device for an x-ray thickness measuring systemFISCHER HELMUT·Filed 1992·Granted May 3, 1994·11 cites·13 claims
- 2346US4660633APlate heat exchangerFISCHER HELMUT·Filed 1985·Granted Apr 28, 1987·10 cites·4 claims
- 2445US4293767AApparatus for measuring the thickness of thin layersFISCHER HELMUT·Filed 1979·Granted Oct 6, 1981·9 cites·14 claims
- 2544US2010171215A1Method of Producing Optoelectronic Components and Optoelectronic ComponentFISCHER HELMUT·Filed 2008·Application pending·0 cites
- 2641US5193289AApparatus for measuring the thickness of thin layersFISCHER HELMUT·Filed 1992·Granted Mar 16, 1993·8 cites·63 claims
- 2741US4899577ADevice for a hardness measuring instrumentFISCHER HELMUT·Filed 1988·Granted Feb 13, 1990·8 cites·16 claims
- 2839US5053703AElectromagnetic probe for measuring the thickness of skin layersFISCHER HELMUT·Filed 1989·Granted Oct 1, 1991·6 cites·35 claims
- 2939US4406948ADevice for measuring thin films by means of beta radiationFISCHER HELMUT·Filed 1980·Granted Sep 27, 1983·7 cites·16 claims
- 3037US4664183APlate heat exchanger and pressing tool for the production thereofFISCHER HELMUT·Filed 1985·Granted May 12, 1987·5 cites·8 claims
- 3133US4475041AAperture device for measuring thin filmsFISCHER HELMUT·Filed 1982·Granted Oct 2, 1984·3 cites·21 claims
- 3231US4956074AMicroprobeFISCHER HELMUT·Filed 1989·Granted Sep 11, 1990·1 cites·22 claims
- 3331US4848140AGuide device for a test body of a hardness measuring instrumentFISCHER HELMUT·Filed 1988·Granted Jul 18, 1989·2 cites·20 claims
- 3428US4401518AMethod of measuring thickness of a tin layer and thickness measuring device thereforFISCHER HELMUT·Filed 1981·Granted Aug 30, 1983·2 cites·10 claims
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