Inventor · disambiguated record
Nicholas M. Van Heel
Also filed as: VAN HEEL NICHOLAS · VAN HEEL NICHOLAS M · VAN HEEL NICHOLAS MARTIN
14 granted patents·1 pending application·562 citations·filing 1999–2005
94Inventor score
Top patents by PatentIndex Score
15 records- 0197US6420925B1Programmable latch device with integrated programmable elementIBM·Filed 2001·Granted Jul 16, 2002·91 cites·22 claims
- 0295US6373771B1Integrated fuse latch and shift register for efficient programming and fuse readoutIBM·Filed 2001·Granted Apr 16, 2002·104 cites·24 claims
- 0394US6346846B1Methods and apparatus for blowing and sensing antifusesIBM·Filed 1999·Granted Feb 12, 2002·109 cites·34 claims
- 0490US6384666B1Antifuse latch device with controlled current programming and variable trip pointIBM·Filed 2001·Granted May 7, 2002·56 cites·19 claims
- 0589US6400202B1Programmable delay element and synchronous DRAM using the sameIBM·Filed 2001·Granted Jun 4, 2002·48 cites·7 claims
- 0686US6930503B2System for testing integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 16, 2005·28 cites·40 claims
- 0786US6531410B2Intrinsic dual gate oxide MOSFET using a damascene gate processIBM·Filed 2001·Granted Mar 11, 2003·35 cites·21 claims
- 0882US6756805B2System for testing integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 29, 2004·23 cites·24 claims
- 0978US6348827B1Programmable delay element and synchronous DRAM using the sameIBM·Filed 2000·Granted Feb 19, 2002·24 cites·6 claims
- 1074US7276775B2Intrinsic dual gate oxide MOSFET using a damascene gate processIBM·Filed 2002·Granted Oct 2, 2007·15 cites·4 claims
- 1168US6570806B2System and method for improving DRAM single cell fail fixability and flexibility repair at module level and universal laser fuse/anti-fuse latch thereforIBM·Filed 2001·Granted May 27, 2003·17 cites·23 claims
- 1257US6339559B1Decode scheme for programming antifuses arranged in banksIBM·Filed 2001·Granted Jan 15, 2002·9 cites·15 claims
- 1346US6452439B1Inductive voltage spike generator with diode shuntIBM·Filed 2001·Granted Sep 17, 2002·2 cites·20 claims
- 1440US2005270058A1System for testing integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2005·Application pending·0 cites
- 1536US6972613B2Fuse latch circuit with non-disruptive re-interrogationIBM·Filed 2003·Granted Dec 6, 2005·1 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →