Inventor · disambiguated record
Nazmul Habib
Also filed as: HABIB NAZMUL
57 granted patents·8 pending applications·272 citations·filing 2006–2022
98Inventor score
Top patents by PatentIndex Score
65 records- 0193US8055822B2Multicore processor having storage for core-specific operational dataIBM·Filed 2007·Granted Nov 8, 2011·32 cites·18 claims
- 0290US9202554B2Methods and circuits for generating physically unclonable functionIBM·Filed 2014·Granted Dec 1, 2015·13 cites·16 claims
- 0389US8421495B1Speed binning for dynamic and adaptive power controlANEMIKOS THEODOROS E·Filed 2011·Granted Apr 16, 2013·11 cites·24 claims
- 0489US8114686B2Phase change material based temperature sensorHABIB NAZMUL·Filed 2010·Granted Feb 14, 2012·12 cites·19 claims
- 0588US10989754B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Apr 27, 2021·2 cites·13 claims
- 0688US10564214B2Optimization of integrated circuit reliabilityIBM·Filed 2017·Granted Feb 18, 2020·2 cites·12 claims
- 0788US7512915B2Embedded test circuit for testing integrated circuits at the die levelIBM·Filed 2007·Granted Mar 31, 2009·14 cites·19 claims
- 0887US9739824B2Optimization of integrated circuit reliabilityIBM·Filed 2016·Granted Aug 22, 2017·2 cites·10 claims
- 0986US9064087B2Semiconductor device reliability model and methodologies for use thereofIBM·Filed 2014·Granted Jun 23, 2015·7 cites·12 claims
- 1086US7382149B2System for acquiring device parametersIBM·Filed 2006·Granted Jun 3, 2008·15 cites·20 claims
- 1185US7917451B2Methods, apparatus, and program products to optimize semiconductor product yield prediction for performance and leakage screensIBM·Filed 2008·Granted Mar 29, 2011·10 cites·20 claims
- 1285US7653888B2System for and method of integrating test structures into an integrated circuitIBM·Filed 2007·Granted Jan 26, 2010·15 cites·20 claims
- 1384US11682646B2IC chip package with dummy solder structure under corner, and related methodMARVELL ASIA PTE LTD·Filed 2021·Granted Jun 20, 2023·1 cites·7 claims
- 1484US11171104B2IC chip package with dummy solder structure under corner, and related methodMARVELL INT LTD·Filed 2019·Granted Nov 9, 2021·4 cites·18 claims
- 1584US9489482B1Reliability-optimized selective voltage binningIBM·Filed 2015·Granted Nov 8, 2016·4 cites·20 claims
- 1683US10539611B2Integrated circuit chip reliability qualification using a sample-specific expected fail rateIBM·Filed 2017·Granted Jan 21, 2020·2 cites·20 claims
- 1783US8095907B2Reliability evaluation and system fail warning methods using on chip parametric monitorsBICKFORD JEANNE P·Filed 2007·Granted Jan 10, 2012·9 cites·10 claims
- 1883US7795605B2Phase change material based temperature sensorIBM·Filed 2007·Granted Sep 14, 2010·12 cites·16 claims
- 1982US9506977B2Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studiesIBM·Filed 2014·Granted Nov 29, 2016·4 cites·20 claims
- 2082US8120356B2Measurement methodology and array structure for statistical stress and test of reliabilty structuresAGARWAL KANAK B·Filed 2009·Granted Feb 21, 2012·11 cites·25 claims
- 2181US11810832B2Heat sink configuration for multi-chip moduleMARVELL ASIA PTE LTD·Filed 2021·Granted Nov 7, 2023·1 cites·12 claims
- 2281US10067184B2Product performance test binningANEMIKOS THEODOROS·Filed 2011·Granted Sep 4, 2018·4 cites·22 claims
- 2381US7560946B2Method of acceptance for semiconductor devicesIBM·Filed 2007·Granted Jul 14, 2009·10 cites·7 claims
- 2480US9639645B2Integrated circuit chip reliability using reliability-optimized failure mechanism targetingGLOBALFOUNDRIES INC·Filed 2015·Granted May 2, 2017·3 cites·20 claims
- 2579US7656182B2Testing method using a scalable parametric measurement macroIBM·Filed 2007·Granted Feb 2, 2010·9 cites·34 claims
- 2679US7487477B2Parametric-based semiconductor designIBM·Filed 2006·Granted Feb 3, 2009·9 cites·9 claims
- 2778US9430603B1Scaling voltages in relation to die locationIBM·Filed 2015·Granted Aug 30, 2016·2 cites·17 claims
- 2878US8943444B2Semiconductor device reliability model and methodologies for use thereofIBM·Filed 2013·Granted Jan 27, 2015·4 cites·8 claims
- 2978US8020138B2Voltage island performance/leakage screen monitor for IP characterizationIBM·Filed 2008·Granted Sep 13, 2011·9 cites·8 claims
- 3077US7803644B2Across reticle variation modeling and related reticleIBM·Filed 2007·Granted Sep 28, 2010·6 cites·4 claims
- 3176US8949767B2Reliability evaluation and system fail warning methods using on chip parametric monitorsMENTOR GRAPHICS CORP·Filed 2013·Granted Feb 3, 2015·2 cites·17 claims
- 3272US10996259B2Optimization of integrated circuit reliabilityIBM·Filed 2020·Granted May 4, 2021·0 cites·17 claims
- 3372US7882455B2Circuit and method using distributed phase change elements for across-chip temperature profilingIBM·Filed 2008·Granted Feb 1, 2011·8 cites·19 claims
- 3472US7868640B2Array-based early threshold voltage recovery characterization measurementIBM·Filed 2008·Granted Jan 11, 2011·6 cites·20 claims
- 3571US11054459B2Optimization of integrated circuit reliabilityIBM·Filed 2019·Granted Jul 6, 2021·0 cites·15 claims
- 3670US10168685B2Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studiesIBM·Filed 2016·Granted Jan 1, 2019·1 cites·20 claims
- 3768US9618566B2Systems and methods to prevent incorporation of a used integrated circuit chip into a productGLOBALFOUNDRIES INC·Filed 2015·Granted Apr 11, 2017·1 cites·20 claims
- 3868US9082875B2Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devicesIBM·Filed 2012·Granted Jul 14, 2015·2 cites·14 claims
- 3968US7884599B2HDL design structure for integrating test structures into an integrated circuit designIBM·Filed 2008·Granted Feb 8, 2011·5 cites·10 claims
- 4067US8504975B2Reliability evaluation and system fail warning methods using on chip parametric monitorsBICKFORD JEANNE P·Filed 2012·Granted Aug 6, 2013·1 cites·27 claims
- 4166US9880892B2System and method for managing semiconductor manufacturing defectsIBM·Filed 2014·Granted Jan 30, 2018·1 cites·17 claims
- 4264US9354953B2System integrator and system integration method with reliability optimized integrated circuit chip selectionIBM·Filed 2014·Granted May 31, 2016·1 cites·20 claims
- 4363US9058250B2In-situ computing system failure avoidanceIBM·Filed 2013·Granted Jun 16, 2015·1 cites·20 claims
- 4462US10794952B2Product performance test binningIBM·Filed 2018·Granted Oct 6, 2020·0 cites·18 claims
- 4562US9625325B2System and method for identifying operating temperatures and modifying of integrated circuitsGLOBALFOUNDRIES INC·Filed 2015·Granted Apr 18, 2017·1 cites·20 claims
- 4658US9117045B2System and method to predict chip IDDQ and control leakage componentsSPENCE BICKFORD JEANNE P·Filed 2008·Granted Aug 25, 2015·2 cites·26 claims
- 4756US9395403B2Optimization of integrated circuit reliabilityIBM·Filed 2013·Granted Jul 19, 2016·0 cites·20 claims
- 4855US10162325B2Application of stress conditions for homogenization of stress samples in semiconductor product acceleration studiesIBM·Filed 2016·Granted Dec 25, 2018·0 cites·20 claims
- 4955US9891275B2Integrated circuit chip reliability qualification using a sample-specific expected fail rateIBM·Filed 2015·Granted Feb 13, 2018·0 cites·20 claims
- 5053US10089161B2System and method for managing semiconductor manufacturing defectsIBM·Filed 2017·Granted Oct 2, 2018·0 cites·19 claims
Showing the top 50 of 65 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Nazmul Habib files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →