Inventor · disambiguated record
Zain Saidin
Also filed as: SAIDIN ZAIN · SAIDIN ZAIN K · SAIDIN ZAIN KAHUNA
17 granted patents·8 pending applications·1,091 citations·filing 1988–2011
96Inventor score
Top patents by PatentIndex Score
25 records- 0198US7646906B2Computer-implemented methods for detecting defects in reticle design dataKLA TENCOR TECH CORP·Filed 2005·Granted Jan 12, 2010·85 cites·22 claims
- 0298US5563702AAutomated photomask inspection apparatus and methodKLA INSTR CORP·Filed 1994·Granted Oct 8, 1996·386 cites·41 claims
- 0396US7904845B2Determining locations on a wafer to be reviewed during defect reviewKLA TENCOR CORP·Filed 2007·Granted Mar 8, 2011·50 cites·24 claims
- 0496US5737072AAutomated photomask inspection apparatus and methodKLA INSTR CORP·Filed 1996·Granted Apr 7, 1998·221 cites·41 claims
- 0595US7440093B1Apparatus and methods for providing selective defect sensitivityKLA TENCOR TECH CORP·Filed 2007·Granted Oct 21, 2008·36 cites·19 claims
- 0695US7297453B2Systems and methods for mitigating variances on a patterned wafer using a prediction modelKLA TENCOR TECH CORP·Filed 2006·Granted Nov 20, 2007·25 cites·15 claims
- 0794US6076465ASystem and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 1997·Granted Jun 20, 2000·113 cites·25 claims
- 0893US7303842B2Systems and methods for modifying a reticle's optical propertiesKLA TENCOR TECH CORP·Filed 2006·Granted Dec 4, 2007·20 cites·39 claims
- 0990US7271891B1Apparatus and methods for providing selective defect sensitivityKLA TENCOR TECH CORP·Filed 2004·Granted Sep 18, 2007·47 cites·33 claims
- 1088US6844927B2Apparatus and methods for removing optical abberations during an optical inspectionKLA TENCOR TECH CORP·Filed 2003·Granted Jan 18, 2005·35 cites·33 claims
- 1180US9710903B2System and method for detecting design and process defects on a wafer using process monitoring featuresFOUQUET CHRISTOPHE·Filed 2009·Granted Jul 18, 2017·10 cites·50 claims
- 1275US8804137B2Unique mark and method to determine critical dimension uniformity and registration of reticles combined with wafer overlay capabilityCHOI DONGSUB·Filed 2010·Granted Aug 12, 2014·4 cites·21 claims
- 1375US5023528AMethod of three-phase winding motor control of rotary motor-driven linear actuators, linear motor-actuated carriages, and similar systems, and apparatus for practicing the sameTERADYNE INC·Filed 1988·Granted Jun 11, 1991·28 cites·10 claims
- 1469US6731787B1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2002·Granted May 4, 2004·9 cites·8 claims
- 1568US6381358B1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2000·Granted Apr 30, 2002·15 cites·25 claims
- 1657US2009324054A1System and method for determing reticle defect printabilityVACCA ANTHONY·Filed 2009·Application pending·0 cites
- 1754US7300729B2Method for monitoring a reticleKLA TENCOR TECH CORP·Filed 2006·Granted Nov 27, 2007·4 cites·14 claims
- 1854US2007140548A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2006·Application pending·0 cites
- 1954US2008133160A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2007·Application pending·0 cites
- 2051US7300725B2Method for determining and correcting reticle variationsKLA TENCOR TECH CORP·Filed 2006·Granted Nov 27, 2007·3 cites·13 claims
- 2143US2005140970A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2005·Application pending·0 cites
- 2241US2003138138A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2003·Application pending·0 cites
- 2340US2004096094A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2003·Application pending·0 cites
- 2438US2002126888A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2002·Application pending·0 cites
- 2538US2012223227A1Apparatus and methods for real-time three-dimensional sem imaging and viewing of semiconductor wafersCHEN CHIEN-HUEI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →