Inventor · disambiguated record
David G. Brochu, Jr.
Also filed as: BROCHU JR DAVID G
4 granted patents·1 pending application·13 citations·filing 2011–2015
68Inventor score
Top patents by PatentIndex Score
5 records- 0178US8587383B2Measuring bias temperature instability induced ring oscillator frequency degradationBROCHU JR DAVID G·Filed 2011·Granted Nov 19, 2013·6 cites·20 claims
- 0274US9059281B2Dual L-shaped drift regions in an LDMOS device and method of making the sameIBM·Filed 2013·Granted Jun 16, 2015·4 cites·17 claims
- 0369US8754655B2Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migrationBROCHU JR DAVID G·Filed 2011·Granted Jun 17, 2014·3 cites·25 claims
- 0441US10103060B2Test structures for dielectric reliability evaluationsGLOBALFOUNDRIES INC·Filed 2015·Granted Oct 16, 2018·0 cites·20 claims
- 0533US2012187974A1Dual Stage Voltage Ramp Stress Test for Gate DielectricsBROCHU JR DAVID G·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →