Inventor · disambiguated record
Sven Schramm
Also filed as: SCHRAMM SVEN
4 granted patents·9 pending applications·3 citations·filing 2007–2024
58Inventor score
Files withAPPLIED MATERIALS INC8APPLIED MATERIALS GMBH & CO KG1LIST MATTHIAS1LIU JIAN1MAURER PHILIPP1
Top patents by PatentIndex Score
13 records- 0166US12422357B2Chamber moisture control using narrow optical filters measuring emission linesAPPLIED MATERIALS INC·Filed 2023·Granted Sep 23, 2025·0 cites·10 claims
- 0265US8133589B2Temperable glass coatingLIST MATTHIAS·Filed 2007·Granted Mar 13, 2012·3 cites·15 claims
- 0361US2025362221A1Calibration kit for retarding energy analyzer sensorsAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 0452US10081866B2Evaporation apparatus with gas supplyAPPLIED MATERIALS INC·Filed 2013·Granted Sep 25, 2018·0 cites·14 claims
- 0545US2011048515A1Passivation layer for wafer based solar cells and method of manufacturing thereofAPPLIED MATERIALS INC·Filed 2009·Application pending·0 cites
- 0644US2008302653A1Method And Device For Producing An Anti-Reflection Or Passivation Layer For Solar CellsAPPLIED MATERIALS INC·Filed 2008·Application pending·0 cites
- 0744US2009199901A1Photovoltaic device comprising a sputter deposited passivation layer as well as a method and apparatus for producing such a deviceAPPLIED MATERIALS INC·Filed 2008·Application pending·0 cites
- 0842US2009195865A1Infrared radiation reflecting layer system and method for the production thereofAPPLIED MATERIALS GMBH & CO KG·Filed 2007·Application pending·0 cites
- 0942US2009320755A1Arrangement for coating a crystalline silicon solar cell with an antireflection/passivation layerLIU JIAN·Filed 2008·Application pending·0 cites
- 1039US2012107504A1Evaporation system and methodMAURER PHILIPP·Filed 2010·Application pending·0 cites
- 1138US2011195184A1Substrate protection device and methodAPPLIED MATERIALS INC·Filed 2010·Application pending·0 cites
- 1236US2011079178A1Thickness measuring device, coating installation, method of measuring the thickness of a layer, and use of a thickness measuring deviceAPPLIED MATERIALS INC·Filed 2009·Application pending·0 cites
- 1327US8709158B2Thermal management of film deposition processesSCHRAMM SVEN·Filed 2010·Granted Apr 29, 2014·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →