Inventor · disambiguated record
Jed Davidow
Also filed as: DAVIDOW JED · DAVIDOW JED E
6 granted patents·1 pending application·422 citations·filing 1999–2023
88Inventor score
Top patents by PatentIndex Score
7 records- 0194US6521080B2Method and apparatus for monitoring a process by employing principal component analysisAPPLIED MATERIALS INC·Filed 2001·Granted Feb 18, 2003·76 cites·16 claims
- 0290US6455437B1Method and apparatus for monitoring the process state of a semiconductor device fabrication processAPPLIED MATERIALS INC·Filed 1999·Granted Sep 24, 2002·111 cites·37 claims
- 0390US6413867B1Film thickness control using spectral interferometryAPPLIED MATERIALS INC·Filed 1999·Granted Jul 2, 2002·101 cites·17 claims
- 0489US6368975B1Method and apparatus for monitoring a process by employing principal component analysisAPPLIED MATERIALS INC·Filed 1999·Granted Apr 9, 2002·90 cites·14 claims
- 0582US6589869B2Film thickness control using spectral interferometryAPPLIED MATERIALS INC·Filed 2002·Granted Jul 8, 2003·26 cites·20 claims
- 0678US6896763B2Method and apparatus for monitoring a process by employing principal component analysisFiled 2003·Granted May 24, 2005·18 cites·12 claims
- 0751US2024385142A1Ultrasound transducer element continuity test visualizationEXO IMAGING INC·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →