Inventor · disambiguated record
Jongsin Yun
Also filed as: YUN JONGSIN
9 granted patents·1 pending application·33 citations·filing 2014–2022
82Inventor score
Top patents by PatentIndex Score
10 records- 0191US9799393B1Methods, apparatus and system for providing NMOS-only memory cellsGLOBALFOUNDRIES INC·Filed 2016·Granted Oct 24, 2017·10 cites·16 claims
- 0287US9293556B2Semiconductor structure including a ferroelectric transistor and method for the formation thereofGLOBALFOUNDRIES INC·Filed 2014·Granted Mar 22, 2016·10 cites·11 claims
- 0385US9536992B2Semiconductor structure including a ferroelectric transistor and method for the formation thereofGLOBALFOUNDRIES INC·Filed 2016·Granted Jan 3, 2017·5 cites·16 claims
- 0477US9224455B1Method and apparatus for bit-line sensing gates on an SRAM cellGLOBALFOUNDRIES INC·Filed 2014·Granted Dec 29, 2015·8 cites·15 claims
- 0552US12009044B2Memory built-in self-test with automated multiple step reference trimmingSIEMENS IND SOFTWARE INC·Filed 2020·Granted Jun 11, 2024·0 cites·17 claims
- 0648US2018012647A1Methods, apparatus and system for providing nmos-only memory cellsGLOBALFOUNDRIES INC·Filed 2017·Application pending·0 cites
- 0746US12046315B2Memory built-in self-test with automated reference trim feedback for memory sensingSIEMENS IND SOFTWARE INC·Filed 2020·Granted Jul 23, 2024·0 cites·11 claims
- 0841US12488852B2Read-only memory diagnosis and repairSIEMENS IND SOFTWARE INC·Filed 2021·Granted Dec 2, 2025·0 cites·19 claims
- 0937US12505896B2Memory built-in self-test with address skipping trim searchSIEMENS IND SOFTWARE INC·Filed 2022·Granted Dec 23, 2025·0 cites·18 claims
- 1033US11929136B2Reference bits test and repair using memory built-in self-testSIEMENS IND SOFTWARE INC·Filed 2021·Granted Mar 12, 2024·0 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →