Inventor · disambiguated record
Leonard Tedeschi
Also filed as: TEDESCHI LEONARD · TEDESCHI LEONARD M · TEDESCHI LEONARD MICHAEL
25 granted patents·7 pending applications·50 citations·filing 2013–2025
93Inventor score
Top patents by PatentIndex Score
32 records- 0195US9725302B1Wafer processing equipment having exposable sensing layersAPPLIED MATERIALS INC·Filed 2016·Granted Aug 8, 2017·18 cites·20 claims
- 0294US12265377B2Autonomous substrate processing systemAPPLIED MATERIALS INC·Filed 2023·Granted Apr 1, 2025·3 cites·17 claims
- 0394US11709477B2Autonomous substrate processing systemAPPLIED MATERIALS INC·Filed 2021·Granted Jul 25, 2023·3 cites·18 claims
- 0493US10083883B2Wafer processing equipment having capacitive micro sensorsAPPLIED MATERIALS INC·Filed 2016·Granted Sep 25, 2018·9 cites·18 claims
- 0593US9975758B2Wafer processing equipment having exposable sensing layersAPPLIED MATERIALS INC·Filed 2017·Granted May 22, 2018·8 cites·20 claims
- 0691US11735486B2Process monitor device having a plurality of sensors arranged in concentric circlesAPPLIED MATERIALS INC·Filed 2020·Granted Aug 22, 2023·2 cites·14 claims
- 0789US11781214B2Differential capacitive sensors for in-situ film thickness and dielectric constant measurementAPPLIED MATERIALS INC·Filed 2019·Granted Oct 10, 2023·2 cites·13 claims
- 0886US12123090B2Differential capacitive sensor for in-situ film thickness and dielectric constant measurementAPPLIED MATERIALS INC·Filed 2023·Granted Oct 22, 2024·0 cites·7 claims
- 0985US12009236B2Sensors and system for in-situ edge ring erosion monitorAPPLIED MATERIALS INC·Filed 2019·Granted Jun 11, 2024·3 cites·7 claims
- 1078US10067070B2Particle monitoring deviceAPPLIED MATERIALS INC·Filed 2015·Granted Sep 4, 2018·2 cites·14 claims
- 1175US2024404835A1Chambers and coatings for reducing backside damageAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1274US2024321610A1Sensors and system for in-situ edge ring erosion monitorAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1373US12163911B2Capacitive sensor housing for chamber condition monitoringAPPLIED MATERIALS INC·Filed 2022·Granted Dec 10, 2024·0 cites·14 claims
- 1466US12094716B2Chambers and coatings for reducing backside damageAPPLIED MATERIALS INC·Filed 2021·Granted Sep 17, 2024·0 cites·19 claims
- 1565US12437979B2Capacitive sensors and capacitive sensing locations for plasma chamber condition monitoringAPPLIED MATERIALS INC·Filed 2020·Granted Oct 7, 2025·0 cites·12 claims
- 1665US2025157802A1Etch feedback for control of upstream processAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1764US11545346B2Capacitive sensing data integration for plasma chamber condition monitoringAPPLIED MATERIALS INC·Filed 2020·Granted Jan 3, 2023·0 cites·8 claims
- 1863US11415538B2Capacitive sensor housing for chamber condition monitoringAPPLIED MATERIALS INC·Filed 2020·Granted Aug 16, 2022·0 cites·8 claims
- 1963US11348846B2Wafer processing tool having a micro sensorAPPLIED MATERIALS INC·Filed 2020·Granted May 31, 2022·0 cites·16 claims
- 2061US12237158B2Etch feedback for control of upstream processAPPLIED MATERIALS INC·Filed 2020·Granted Feb 25, 2025·0 cites·14 claims
- 2161US11088000B2Wafer based corrosion and time dependent chemical effectsAPPLIED MATERIALS INC·Filed 2019·Granted Aug 10, 2021·0 cites·13 claims
- 2259US10923405B2Wafer processing equipment having capacitive micro sensorsAPPLIED MATERIALS INC·Filed 2018·Granted Feb 16, 2021·0 cites·19 claims
- 2357US10718719B2Particle monitoring deviceAPPLIED MATERIALS INC·Filed 2018·Granted Jul 21, 2020·0 cites·7 claims
- 2455US2025279310A1Substrate warpage compensationAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 2554US10515862B2Wafer based corrosion and time dependent chemical effectsAPPLIED MATERIALS INC·Filed 2017·Granted Dec 24, 2019·0 cites·6 claims
- 2652US10818564B2Wafer processing tool having a micro sensorAPPLIED MATERIALS INC·Filed 2016·Granted Oct 27, 2020·0 cites·12 claims
- 2750US10818561B2Process monitor device having a plurality of sensors arranged in concentric circlesAPPLIED MATERIALS INC·Filed 2016·Granted Oct 27, 2020·0 cites·15 claims
- 2848US11581206B2Capacitive sensor for chamber condition monitoringAPPLIED MATERIALS INC·Filed 2020·Granted Feb 14, 2023·0 cites·13 claims
- 2946US2022165593A1Feedforward control of multi-layer stacks during device fabricationAPPLIED MATERIALS INC·Filed 2020·Application pending·0 cites
- 3044US11551905B2Resonant process monitorAPPLIED MATERIALS INC·Filed 2018·Granted Jan 10, 2023·0 cites·20 claims
- 3142US2015132959A1Pattern formation and transfer directly on silicon based filmsTEDESCHI LEONARD·Filed 2013·Application pending·0 cites
- 3234US2017221783A1Self-aware production wafersTEDESCHI LEONARD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →