Inventor · disambiguated record
Billy W. Ward
Also filed as: WARD BILLY W · WARD BILLY WALTER
43 granted patents·4 pending applications·1,600 citations·filing 1981–2015
98Inventor score
Top patents by PatentIndex Score
47 records- 0199US7557359B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·71 cites·112 claims
- 0299US7554096B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jun 30, 2009·100 cites·66 claims
- 0398US7786452B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Aug 31, 2010·61 cites·77 claims
- 0498US7557358B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·69 cites·71 claims
- 0598US7557360B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·67 cites·28 claims
- 0698US7557361B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jul 7, 2009·67 cites·110 claims
- 0798US7554097B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Jun 30, 2009·74 cites·82 claims
- 0897US7786451B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Aug 31, 2010·58 cites·120 claims
- 0997US7321118B2Scanning transmission ion microscopeALIS CORP·Filed 2005·Granted Jan 22, 2008·39 cites·20 claims
- 1097US4639301AFocused ion beam processingMICRION LTD·Filed 1985·Granted Jan 27, 1987·150 cites·15 claims
- 1196US8110814B2Ion sources, systems and methodsWARD BILLY W·Filed 2009·Granted Feb 7, 2012·33 cites·20 claims
- 1296US7414243B2Transmission ion microscopeALIS CORP·Filed 2005·Granted Aug 19, 2008·33 cites·21 claims
- 1395US7511280B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Mar 31, 2009·26 cites·9 claims
- 1495US7511279B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Mar 31, 2009·29 cites·112 claims
- 1595US7504639B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Mar 17, 2009·24 cites·31 claims
- 1695US4433384APattern data handling system for an electron beam exposure systemVARIAN ASSOCIATES·Filed 1981·Granted Feb 21, 1984·52 cites·14 claims
- 1794US7488952B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 10, 2009·20 cites·23 claims
- 1894US7485873B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 3, 2009·36 cites·25 claims
- 1994US4874947AFocused ion beam imaging and process controlMICRION CORP·Filed 1988·Granted Oct 17, 1989·105 cites·22 claims
- 2093US7521693B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Apr 21, 2009·23 cites·107 claims
- 2193US7495232B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Feb 24, 2009·20 cites·25 claims
- 2293US7368727B2Atomic level ion source and method of manufacture and operationALIS TECHNOLOGY CORP·Filed 2004·Granted May 6, 2008·60 cites·25 claims
- 2392US7601953B2Systems and methods for a gas field ion microscopeALIS CORP·Filed 2006·Granted Oct 13, 2009·16 cites·19 claims
- 2491US6039000AFocused particle beam systems and methods using a tilt columnMICRION CORP·Filed 1998·Granted Mar 21, 2000·106 cites·13 claims
- 2591US5034612AIon source method and apparatusMICRION CORP·Filed 1990·Granted Jul 23, 1991·72 cites·15 claims
- 2690US7518122B2Ion sources, systems and methodsALIS CORP·Filed 2006·Granted Apr 14, 2009·19 cites·10 claims
- 2789US9236225B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2015·Granted Jan 12, 2016·4 cites·23 claims
- 2881US8227753B2Multiple current charged particle methodsNOTTE IV JOHN A·Filed 2009·Granted Jul 24, 2012·6 cites·20 claims
- 2980US6497194B1Focused particle beam systems and methods using a tilt columnFEI CO·Filed 1999·Granted Dec 24, 2002·49 cites·10 claims
- 3079US5155368AIon beam blanking apparatus and methodMICRION CORP·Filed 1991·Granted Oct 13, 1992·37 cites·9 claims
- 3176US8748845B2Ion sources, systems and methodsWARD BILLY W·Filed 2012·Granted Jun 10, 2014·2 cites·28 claims
- 3276US8461557B2Ion sources, systems and methodsCOMUNALE RICHARD·Filed 2008·Granted Jun 11, 2013·5 cites·16 claims
- 3375US7094312B2Focused particle beam systems and methods using a tilt columnFEI CO·Filed 2002·Granted Aug 22, 2006·18 cites·30 claims
- 3472US8558192B2Gas delivery system with voltage gradient for an ion microscopeWARD BILLY W·Filed 2011·Granted Oct 15, 2013·2 cites·22 claims
- 3572US4976843AParticle beam shieldingMICRION CORP·Filed 1990·Granted Dec 11, 1990·27 cites·15 claims
- 3671US9159527B2Systems and methods for a gas field ionization sourceWARD BILLY W·Filed 2008·Granted Oct 13, 2015·3 cites·36 claims
- 3771US9012867B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Apr 21, 2015·1 cites·20 claims
- 3869US8633451B2Ion sources, systems and methodsWARD BILLY W·Filed 2008·Granted Jan 21, 2014·2 cites·18 claims
- 3966US8013300B2Sample decontaminationZEISS CARL NTS LLC·Filed 2009·Granted Sep 6, 2011·3 cites·19 claims
- 4057US9029765B2Ion sources, systems and methodsCARL ZEISS MICROSCOPY LLC·Filed 2013·Granted May 12, 2015·0 cites·21 claims
- 4157US2010136255A1Ice layers in charged particle systems and methodsCARL ZEISS SMT INC·Filed 2009·Application pending·0 cites
- 4252US4424450AHybrid moving stage and rastered electron beam lithography system employing approximate correction circuitVARIAN ASSOCIATES·Filed 1981·Granted Jan 3, 1984·6 cites·6 claims
- 4349US2007227883A1Systems and methods for a helium ion pumpWARD BILLY W·Filed 2007·Application pending·0 cites
- 4449US2013232698A1Systems and methods for mattress lifting to aid bed-makingWARD BILLY WALTER·Filed 2013·Application pending·0 cites
- 4546US9123502B2Scan methodWARD BILLY W·Filed 2011·Granted Sep 1, 2015·0 cites·23 claims
- 4643US2007228287A1Systems and methods for a gas field ionization sourceALIS TECHNOLOGY CORP·Filed 2006·Application pending·0 cites
- 4729US4673101AEvacuable chamber enclosingMICRION LTD·Filed 1986·Granted Jun 16, 1987·5 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →