Assignee
MICRION CORP
US·14 granted patents·927 citations·filing 1988–1999
Top patents by PatentIndex Score
14 records- 0194US4874947AFocused ion beam imaging and process controlMICRION CORP·Filed 1988·Granted Oct 17, 1989·105 cites·22 claims
- 0292US5851413AGas delivery systems for particle beam processingMICRION CORP·Filed 1996·Granted Dec 22, 1998·167 cites·20 claims
- 0392US5103102ALocalized vacuum apparatus and methodMICRION CORP·Filed 1989·Granted Apr 7, 1992·79 cites·37 claims
- 0491US6039000AFocused particle beam systems and methods using a tilt columnMICRION CORP·Filed 1998·Granted Mar 21, 2000·106 cites·13 claims
- 0591US5916424AThin film magnetic recording heads and systems and methods for manufacturing the sameMICRION CORP·Filed 1996·Granted Jun 29, 1999·62 cites·22 claims
- 0691US5034612AIon source method and apparatusMICRION CORP·Filed 1990·Granted Jul 23, 1991·72 cites·15 claims
- 0789US6042738APattern film repair using a focused particle beam systemMICRION CORP·Filed 1997·Granted Mar 28, 2000·142 cites·25 claims
- 0884US6354438B1Focused ion beam apparatus for forming thin-film magnetic recording headsMICRION CORP·Filed 1999·Granted Mar 12, 2002·68 cites·13 claims
- 0979US5155368AIon beam blanking apparatus and methodMICRION CORP·Filed 1991·Granted Oct 13, 1992·37 cites·9 claims
- 1072US4976843AParticle beam shieldingMICRION CORP·Filed 1990·Granted Dec 11, 1990·27 cites·15 claims
- 1159US6004437AThin-film magnetic recording head manufacturing methodMICRION CORP·Filed 1997·Granted Dec 21, 1999·13 cites·4 claims
- 1258US4943732AMethod and apparatus for defect detection and locationMICRION CORP·Filed 1989·Granted Jul 24, 1990·23 cites·22 claims
- 1356US6332962B1Thin-film magnetic recording head manufacture using selective imagingMICRION CORP·Filed 1998·Granted Dec 25, 2001·11 cites·12 claims
- 1449US6113056AWorkpiece vibration damperMICRION CORP·Filed 1998·Granted Sep 5, 2000·15 cites·15 claims
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