Inventor · disambiguated record
Yoshiro Shiokawa
Also filed as: SHIOKAWA YOSHIRO
29 granted patents·4 pending applications·224 citations·filing 1984–2012
96Inventor score
Files withANELVA CORP21SHIOKAWA YOSHIRO5CANON ANELVA CORP3CANON ANELVA TECHNIX CORP1NAKAMURA MEGUMI1
Top patents by PatentIndex Score
33 records- 0185US6768108B2Ion attachment mass spectrometry apparatus, ionization apparatus, and ionization methodANELVA CORP·Filed 2003·Granted Jul 27, 2004·35 cites·8 claims
- 0284US7952069B2Mass spectrometer and mass spectrometry methodCANON ANELVA CORP·Filed 2009·Granted May 31, 2011·11 cites·13 claims
- 0384US7005634B2Ionization apparatusANELVA CORP·Filed 2002·Granted Feb 28, 2006·21 cites·16 claims
- 0484US6399213B2Surface treated vacuum material and a vacuum chamber having an interior surface comprising sameANELVA CORP·Filed 2001·Granted Jun 4, 2002·21 cites·16 claims
- 0583US4639597AAuger electron spectrometer capable of attaining a high resolutionANELVA CORP·Filed 1984·Granted Jan 27, 1987·22 cites·11 claims
- 0678US7202474B2Ion attachment mass spectrometry apparatusANELVA CORP·Filed 2006·Granted Apr 10, 2007·4 cites·6 claims
- 0775US7842919B2Q-pole type mass spectrometerCANON ANELVA CORP·Filed 2008·Granted Nov 30, 2010·2 cites·4 claims
- 0875US6507020B2Halide compound mass spectrometry method and mass spectrometry apparatusANELVA CORP·Filed 2000·Granted Jan 14, 2003·11 cites·18 claims
- 0974US6635868B2Mass spectrometry apparatusANELVA CORP·Filed 2001·Granted Oct 21, 2003·11 cites·14 claims
- 1074US6559443B2Ionization apparatus and ionization method for mass spectrometryANELVA CORP·Filed 2001·Granted May 6, 2003·11 cites·9 claims
- 1169US8164051B2Internal standard material, resin composition, and measurement methodSHIOKAWA YOSHIRO·Filed 2009·Granted Apr 24, 2012·1 cites·6 claims
- 1269US7084397B2Ion attachment mass spectrometry apparatusANELVA CORP·Filed 2004·Granted Aug 1, 2006·7 cites·10 claims
- 1369US4752685AElectronic spectrometer for identifying element conditions of a sample surface by utilizing an energy spectrum of charged particlesANELVA CORP·Filed 1986·Granted Jun 21, 1988·15 cites·6 claims
- 1465US8049166B2Mass spectrometer system and mass spectrometry methodCANON ANELVA CORP·Filed 2009·Granted Nov 1, 2011·1 cites·8 claims
- 1565US6800848B2Method and apparatus for ion attachment mass spectrometryANELVA CORP·Filed 2001·Granted Oct 5, 2004·6 cites·16 claims
- 1663US7164121B2Ion attachment mass spectrometry methodANELVA CORP·Filed 2003·Granted Jan 16, 2007·4 cites·9 claims
- 1763US6590205B2Ionization method for mass spectrometry and mass spectrometry apparatusANELVA CORP·Filed 2001·Granted Jul 8, 2003·5 cites·19 claims
- 1862US8309917B2Mass spectrometry and mass spectrometer used for the sameSHIOKAWA YOSHIRO·Filed 2009·Granted Nov 13, 2012·1 cites·10 claims
- 1961US6479814B2Ion source for ion attachment mass spectrometry apparatusANELVA CORP·Filed 2001·Granted Nov 12, 2002·4 cites·22 claims
- 2058US4652753AMass spectrometer capable of analyzing an insulatorANELVA CORP·Filed 1984·Granted Mar 24, 1987·8 cites·12 claims
- 2156US2007114393A1Q-pole type mass spectrometerSHIOKAWA YOSHIRO·Filed 2006·Application pending·0 cites
- 2254US4562352AAnalyzing apparatus capable of analyzing a surface at a high resolutionANELVA CORP·Filed 1984·Granted Dec 31, 1985·7 cites·32 claims
- 2353US6800850B2Reflection type ion attachment mass spectrometry apparatusANELVA CORP·Filed 2003·Granted Oct 5, 2004·2 cites·17 claims
- 2449US7015461B2Method and apparatus for ion attachment mass spectrometryANELVA CORP·Filed 2001·Granted Mar 21, 2006·1 cites·10 claims
- 2549US2009266979A1Ion attachment mass spectrometer and ion attachment mass spectrometry method thereofCANON ANELVA TECHNIX CORP·Filed 2009·Application pending·0 cites
- 2646US2004245459A1Q-pole type mass spectrometerFiled 2004·Application pending·0 cites
- 2744US6316052B1Method for the surface treatment of vacuum materials and surface treated vacuumANELVA CORP·Filed 1999·Granted Nov 13, 2001·8 cites·24 claims
- 2844US5916388AMethod and apparatus for the treatment of stainless steel surfacesANELVA CORP·Filed 1998·Granted Jun 29, 1999·5 cites·24 claims
- 2942US8410415B2Ion detector for mass spectrometry, method for detecting ion, and method for manufacturing ion detectorNAKAMURA MEGUMI·Filed 2011·Granted Apr 2, 2013·0 cites·11 claims
- 3042US2002027196A1Q-pole type mass spectrometerFiled 2001·Application pending·0 cites
- 3140US8324568B2Mass spectrometer and mass spectrometry methodSHIOKAWA YOSHIRO·Filed 2010·Granted Dec 4, 2012·0 cites·8 claims
- 3239US8436295B2Device for measuring mean free path, vacuum gauge, and method for measuring mean free pathSHIOKAWA YOSHIRO·Filed 2012·Granted May 7, 2013·0 cites·11 claims
- 3330US4785173AElement analyzing apparatusANELVA CORP·Filed 1987·Granted Nov 15, 1988·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →