Assignee
SHIOKAWA YOSHIRO
JP·4 granted patents·1 pending application·2 citations·filing 2006–2012
Top patents by PatentIndex Score
5 records- 0169US8164051B2Internal standard material, resin composition, and measurement methodSHIOKAWA YOSHIRO·Filed 2009·Granted Apr 24, 2012·1 cites·6 claims
- 0262US8309917B2Mass spectrometry and mass spectrometer used for the sameSHIOKAWA YOSHIRO·Filed 2009·Granted Nov 13, 2012·1 cites·10 claims
- 0356US2007114393A1Q-pole type mass spectrometerSHIOKAWA YOSHIRO·Filed 2006·Application pending·0 cites
- 0440US8324568B2Mass spectrometer and mass spectrometry methodSHIOKAWA YOSHIRO·Filed 2010·Granted Dec 4, 2012·0 cites·8 claims
- 0539US8436295B2Device for measuring mean free path, vacuum gauge, and method for measuring mean free pathSHIOKAWA YOSHIRO·Filed 2012·Granted May 7, 2013·0 cites·11 claims
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