Inventor · disambiguated record
Shinichi Oki
Also filed as: OKI SHINICHI
18 granted patents·4 pending applications·270 citations·filing 1989–2023
94Inventor score
Files withAPPLIED MATERIALS INC10MATSUSHITA ELECTRIC INDUSTRIAL CO LTD10PANASONIC CORP1PANASONIC IP MAN CO LTD1
Top patents by PatentIndex Score
22 records- 0191US12165899B2Bipolar electrostatic chuck for etch chamberAPPLIED MATERIALS INC·Filed 2022·Granted Dec 10, 2024·3 cites·20 claims
- 0288US6229329B1Method of testing electrical characteristics of multiple semiconductor integrated circuits simultaneouslyMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted May 8, 2001·56 cites·3 claims
- 0384US11032945B2Heat shield assembly for an epitaxy chamberAPPLIED MATERIALS INC·Filed 2019·Granted Jun 8, 2021·3 cites·18 claims
- 0482US4972489ASound reproducing apparatusMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1989·Granted Nov 20, 1990·41 cites·8 claims
- 0581US9879358B2Heat shield ring for high growth rate EPI chamberAPPLIED MATERIALS INC·Filed 2016·Granted Jan 30, 2018·1 cites·19 claims
- 0678US10704146B2Support assembly for substrate backside discoloration controlAPPLIED MATERIALS INC·Filed 2015·Granted Jul 7, 2020·3 cites·17 claims
- 0776US5605844AInspecting method for semiconductor devicesMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Feb 25, 1997·51 cites·18 claims
- 0873US10446420B2Upper cone for epitaxy chamberAPPLIED MATERIALS INC·Filed 2017·Granted Oct 15, 2019·1 cites·10 claims
- 0973US6297658B1Wafer burn-in cassette and method of manufacturing probe card for use thereinMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Oct 2, 2001·35 cites·8 claims
- 1069US10544518B2Chamber components for epitaxial growth apparatusAPPLIED MATERIALS INC·Filed 2016·Granted Jan 28, 2020·1 cites·11 claims
- 1164US9680053B2Nitride semiconductor devicePANASONIC IP MAN CO LTD·Filed 2015·Granted Jun 13, 2017·1 cites·10 claims
- 1264US5829126AMethod of manufacturing probe cardMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Nov 3, 1998·30 cites·7 claims
- 1362US10978324B2Upper cone for epitaxy chamberAPPLIED MATERIALS INC·Filed 2019·Granted Apr 13, 2021·0 cites·20 claims
- 1462US6400175B2Method of testing semiconductor integrated circuits and testing board for use thereinMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2001·Granted Jun 4, 2002·7 cites·1 claims
- 1558US2025051910A1Chamber component for improved cleaning efficiencyAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1657US6781400B2Method of testing semiconductor integrated circuits and testing board for use thereinMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Granted Aug 24, 2004·5 cites·1 claims
- 1757US6518779B1Probe cardMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1998·Granted Feb 11, 2003·20 cites·7 claims
- 1850US2019062909A1Inject assembly for epitaxial deposition processesAPPLIED MATERIALS INC·Filed 2018·Application pending·0 cites
- 1949US11441236B2Chamber components for epitaxial growth apparatusAPPLIED MATERIALS INC·Filed 2016·Granted Sep 13, 2022·0 cites·20 claims
- 2048US2009208025A1Active noise reduction systemPANASONIC CORP·Filed 2007·Application pending·0 cites
- 2145US5665610ASemiconductor device checking methodMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 1996·Granted Sep 9, 1997·12 cites·10 claims
- 2238US2002190743A1Method of testing semiconductor integrated circuits and testing board for use thereinMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →