Inventor · disambiguated record
John Thornell
Also filed as: THORNELL JOHN · THORNELL JOHN M · THORNELL JOHN MARK
6 granted patents·1 pending application·48 citations·filing 2000–2025
76Inventor score
Files withRUDOLPH TECH INC4AUGUST TECHNOLOGY CORP1ONTO INNOVATION INC1SEMICONDUCTOR TECHNOLOGY & INS1
Top patents by PatentIndex Score
7 records- 0177US7024031B1System and method for inspection using off-angle lightingAUGUST TECHNOLOGY CORP·Filed 2001·Granted Apr 4, 2006·20 cites·25 claims
- 0265US6744913B1System and method for locating image featuresSEMICONDUCTOR TECHNOLOGY & INS·Filed 2000·Granted Jun 1, 2004·28 cites·13 claims
- 0363US2025258445A1Fiducial pattern alignment techniquesONTO INNOVATION INC·Filed 2025·Application pending·0 cites
- 0455US9658169B2System and method of characterizing micro-fabrication processesRUDOLPH TECH INC·Filed 2014·Granted May 23, 2017·0 cites·11 claims
- 0554US10024804B2System and method of characterizing micro-fabrication processesRUDOLPH TECH INC·Filed 2017·Granted Jul 17, 2018·0 cites·12 claims
- 0646US10553504B2Inspection of substratesRUDOLPH TECH INC·Filed 2018·Granted Feb 4, 2020·0 cites·17 claims
- 0742US10466179B2Semiconductor device inspection of metallic discontinuitiesRUDOLPH TECH INC·Filed 2018·Granted Nov 5, 2019·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →