Inventor · disambiguated record
Jang Seok Oh
Also filed as: OH JANG SEOK
8 granted patents·2 pending applications·24 citations·filing 2003–2023
78Inventor score
Files withAPPLIED MATERIALS INC10
Top patents by PatentIndex Score
10 records- 0176US7204888B2Lift pin assembly for substrate processingAPPLIED MATERIALS INC·Filed 2003·Granted Apr 17, 2007·22 cites·21 claims
- 0274US10655223B2Advanced coating method and materials to prevent HDP-CVD chamber arcingAPPLIED MATERIALS INC·Filed 2019·Granted May 19, 2020·0 cites·20 claims
- 0370US10208380B2Advanced coating method and materials to prevent HDP-CVD chamber arcingAPPLIED MATERIALS INC·Filed 2016·Granted Feb 19, 2019·1 cites·20 claims
- 0467US10002745B2Plasma treatment process for in-situ chamber cleaning efficiency enhancement in plasma processing chamberAPPLIED MATERIALS INC·Filed 2016·Granted Jun 19, 2018·1 cites·17 claims
- 0558US11837448B2High-temperature chamber and chamber component cleaning and maintenance method and apparatusAPPLIED MATERIALS INC·Filed 2021·Granted Dec 5, 2023·0 cites·22 claims
- 0656US2025062122A1Implant Hard Mask for SubstratesAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 0753US10883932B2Advanced in-situ particle detection system for semiconductor substrate processing systemsAPPLIED MATERIALS INC·Filed 2019·Granted Jan 5, 2021·0 cites·21 claims
- 0852US10365216B2Advanced in-situ particle detection system for semiconductor substrate processing systemsAPPLIED MATERIALS INC·Filed 2017·Granted Jul 30, 2019·0 cites·19 claims
- 0941US12068180B2Advanced temperature monitoring system and methods for semiconductor manufacture productivityAPPLIED MATERIALS INC·Filed 2019·Granted Aug 20, 2024·0 cites·11 claims
- 1033US2017114462A1High productivity pecvd tool for wafer processing of semiconductor manufacturingAPPLIED MATERIALS INC·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →