Inventor · disambiguated record
Hitoshi Yamanaka
Also filed as: YAMANAKA HITOSHI
5 granted patents·2 pending applications·99 citations·filing 2001–2022
80Inventor score
Top patents by PatentIndex Score
7 records- 0187US7734973B2Testing apparatus and testing method for an integrated circuit, and integrated circuitFUJITSU MICROELECTRONICS LTD·Filed 2006·Granted Jun 8, 2010·17 cites·4 claims
- 0282US7353440B2Multicore processor test methodFUJITSU LTD·Filed 2004·Granted Apr 1, 2008·39 cites·30 claims
- 0382US7178078B2Testing apparatus and testing method for an integrated circuit, and integrated circuitFUJITSU LTD·Filed 2001·Granted Feb 13, 2007·38 cites·26 claims
- 0480US8356217B2Storage circuit, integrated circuit, and scanning methodFUJITSU LTD·Filed 2010·Granted Jan 15, 2013·5 cites·7 claims
- 0564US11673214B2Lead-free solderUCHIHASHI ESTEC CO LTD·Filed 2022·Granted Jun 13, 2023·0 cites·2 claims
- 0634US2014068193A1Semiconductor device and memory test methodFUJITSU LTD·Filed 2013·Application pending·0 cites
- 0734US2013163356A1Semiconductor integrated circuit and method of testing semiconductor integrated circuitFUJITSU LTD·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →