Inventor · disambiguated record
Sajan Marokkey
Also filed as: MAROKKEY SAJAN
20 granted patents·4 pending applications·84 citations·filing 2004–2013
93Inventor score
Top patents by PatentIndex Score
24 records- 0191US7687925B2Alignment marks for polarized light lithography and method for use thereofINFINEON TECHNOLOGIES AG·Filed 2005·Granted Mar 30, 2010·19 cites·17 claims
- 0288US7820458B2Test structures and methodsINFINEON TECHNOLOGIES AG·Filed 2008·Granted Oct 26, 2010·10 cites·12 claims
- 0387US8450122B2Test structures and methodsMAROKKEY SAJAN·Filed 2010·Granted May 28, 2013·7 cites·8 claims
- 0486US7556898B2Overlay target for polarized light lithographyINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 7, 2009·7 cites·17 claims
- 0585US7947431B2Lithography masks and methods of manufacture thereofINFINEON TECHNOLOGIES AG·Filed 2010·Granted May 24, 2011·7 cites·19 claims
- 0682US8203223B2Overlay target for polarized light lithographyMAROKKEY SAJAN·Filed 2010·Granted Jun 19, 2012·3 cites·20 claims
- 0780US8071261B2Lithography masks and methods of manufacture thereofGUTMANN ALOIS·Filed 2007·Granted Dec 6, 2011·6 cites·37 claims
- 0880US7674703B1Gridded contacts in semiconductor devicesINFINEON TECHNOLOGIES AG·Filed 2009·Granted Mar 9, 2010·9 cites·29 claims
- 0973US8715909B2Lithography systems and methods of manufacturing using thereofGUTMANN ALOIS·Filed 2007·Granted May 6, 2014·4 cites·23 claims
- 1070US7799486B2Lithography masks and methods of manufacture thereofINFINEON TECHNOLOGIES AG·Filed 2006·Granted Sep 21, 2010·2 cites·30 claims
- 1169US8183129B2Alignment marks for polarized light lithography and method for use thereofMAROKKEY SAJAN·Filed 2010·Granted May 22, 2012·2 cites·27 claims
- 1267US7666800B2Feature patterning methodsINFINEON TECHNOLOGIES AG·Filed 2008·Granted Feb 23, 2010·2 cites·24 claims
- 1366US8828748B2Test structures and methodsINFINEON TECHNOLOGIES AG·Filed 2013·Granted Sep 9, 2014·1 cites·12 claims
- 1466US7807320B2Overlay target for polarized light lithographyINFINEON TECHNOLOGIES AG·Filed 2009·Granted Oct 5, 2010·1 cites·20 claims
- 1564US8330937B2Stray light feedback for dose control in semiconductor lithography systemsMAROKKEY SAJAN·Filed 2009·Granted Dec 11, 2012·1 cites·18 claims
- 1661US7713824B2Small feature integrated circuit fabricationINFINEON TECHNOLOGIES CORP·Filed 2007·Granted May 11, 2010·1 cites·12 claims
- 1753US8377800B2Alignment marks for polarized light lithography and method for use thereofINFINEON TECHNOLOGIES AG·Filed 2012·Granted Feb 19, 2013·0 cites·20 claims
- 1852US7583362B2Stray light feedback for dose control in semiconductor lithography systemsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 1, 2009·2 cites·28 claims
- 1947US2009201474A1Semiconductor Devices and Methods of Manufacture ThereofMAROKKEY SAJAN·Filed 2008·Application pending·0 cites
- 2046US2009091729A1Lithography Systems and Methods of Manufacturing Using ThereofMAROKKEY SAJAN·Filed 2007·Application pending·0 cites
- 2145US2010187611A1Contacts in Semiconductor DevicesSCHIWON ROBERTO·Filed 2009·Application pending·0 cites
- 2243US2007275330A1Bottom anti-reflective coatingIBM·Filed 2006·Application pending·0 cites
- 2341US7514356B2Ribs for line collapse prevention in damascene structuresINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 7, 2009·0 cites·22 claims
- 2440US8518820B2Methods for forming contacts in semiconductor devicesSCHIWON ROBERTO·Filed 2011·Granted Aug 27, 2013·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →