Inventor · disambiguated record
Michael Sommer
Also filed as: SOMMER MICHAEL · SOMMER MICHAEL B · SOMMER MICHAEL BERNHARD
57 granted patents·8 pending applications·323 citations·filing 1999–2021
98Inventor score
Files withINFINEON TECHNOLOGIES AG43INFINEON TECHNOLOGIES RICHMOND4SOMMER MICHAEL3OTTERSTEDT JAN2QIMONDA AG2
Top patents by PatentIndex Score
65 records- 0193US7304899B2Integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 4, 2007·43 cites·11 claims
- 0292US8822306B2Method for manufacturing a composite wafer having a graphite core, and composite wafer having a graphite coreBERGER RUDOLF·Filed 2011·Granted Sep 2, 2014·16 cites·24 claims
- 0384US9576844B2Method for manufacturing a composite wafer having a graphite core, and composite wafer having a graphite coreINFINEON TECHNOLOGIES AG·Filed 2015·Granted Feb 21, 2017·3 cites·17 claims
- 0481US7355218B2Semiconductor component with a MOS transistorINFINEON TECHNOLOGIES AG·Filed 2005·Granted Apr 8, 2008·10 cites·22 claims
- 0578US9461182B2Memory cellSOMMER MICHAEL·Filed 2007·Granted Oct 4, 2016·9 cites·38 claims
- 0676US7619924B2Device and method for reading out memory informationINFINEON TECHNOLOGIES AG·Filed 2007·Granted Nov 17, 2009·10 cites·25 claims
- 0775US7864565B2Data retention monitorINFINEON TECHNOLOGIES AG·Filed 2007·Granted Jan 4, 2011·9 cites·10 claims
- 0872US6717431B2Method for semiconductor yield loss calculationINFINEON TECHNOLOGIES RICHMOND·Filed 2002·Granted Apr 6, 2004·20 cites·20 claims
- 0971US6979853B2DRAM memory cell and memory cell array with fast read/write accessINFINEON TECHNOLOGIES AG·Filed 2003·Granted Dec 27, 2005·13 cites·14 claims
- 1069US7582701B2Stabilized unsaturated polyester resin mixturesBYK CHEMI GMBH·Filed 2006·Granted Sep 1, 2009·3 cites·13 claims
- 1168US7317603B2Integrated circuit with electrostatic discharge protectionINFINEON TECHNOLOGIES AG·Filed 2006·Granted Jan 8, 2008·4 cites·12 claims
- 1268US6499120B1Usage of redundancy data for displaying failure bit maps for semiconductor devicesINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted Dec 24, 2002·26 cites·24 claims
- 1367US7283419B2Integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 16, 2007·7 cites·12 claims
- 1466US10545225B2Optical sensor device with deep and shallow control electrodesINFINEON TECHNOLOGIES AG·Filed 2017·Granted Jan 28, 2020·1 cites·26 claims
- 1566US7259607B2Integrated semiconductor memory with clock generationINFINEON TECHNOLOGIES AG·Filed 2005·Granted Aug 21, 2007·6 cites·21 claims
- 1666US6849893B2Semiconductor circuit structure and method for fabricating the semiconductor circuit structureINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 1, 2005·13 cites·23 claims
- 1763US11175389B2Optical sensor device with deep and shallow control electrodesINFINEON TECHNOLOGIES AG·Filed 2020·Granted Nov 16, 2021·0 cites·27 claims
- 1862US6718487B1Method for high speed testing with low speed semiconductor test equipmentINFINEON TECHNOLOGIES CORP·Filed 2000·Granted Apr 6, 2004·12 cites·20 claims
- 1960US7337345B2Input circuit for an electronic circuit and a method for controlling the reading-in of a data signalINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 26, 2008·2 cites·20 claims
- 2060US6770928B2Semiconductor memory with vertical selection transistorINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 3, 2004·9 cites·20 claims
- 2160US6670802B2Integrated circuit having a test operating mode and method for testing a multiplicity of such circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Dec 30, 2003·12 cites·7 claims
- 2259US8320153B2Semiconductor device and method for making sameSOMMER MICHAEL·Filed 2008·Granted Nov 27, 2012·1 cites·18 claims
- 2358US9224633B2Method for manufacturing a composite wafer having a graphite core, and composite wafer having a graphite coreINFINEON TECHNOLOGIES AG·Filed 2014·Granted Dec 29, 2015·0 cites·4 claims
- 2458US7246278B2Apparatus for testing a memory moduleINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 17, 2007·10 cites·22 claims
- 2556US7335936B2DRAM memory having vertically arranged selection transistorsINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 26, 2008·7 cites·14 claims
- 2654US7372093B2DRAM memory with vertically arranged selection transistorsINFINEON TECHNOLOGIES AG·Filed 2003·Granted May 13, 2008·6 cites·17 claims
- 2754US7330047B2Receiver circuit arrangement having an inverter circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 12, 2008·2 cites·31 claims
- 2853US7427202B2Means of mounting for electronic components, arrangement and procedureINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 23, 2008·4 cites·60 claims
- 2953US7274218B2Integrated circuitINFINEON TECHNOLOGIES AG·Filed 2005·Granted Sep 25, 2007·2 cites·18 claims
- 3052US7279881B2Integrated circuit for regulating a voltage generatorINFINEON AG·Filed 2005·Granted Oct 9, 2007·3 cites·19 claims
- 3152US6480024B2Circuit configuration for programming a delay in a signal pathINFINEON TECHNOLOGIES AG·Filed 2001·Granted Nov 12, 2002·6 cites·8 claims
- 3252US2021395406A1Reversible cross-linking system for polyvinylaminesSOLENIS TECH LP·Filed 2021·Application pending·0 cites
- 3351US6876025B2Dram cell and space-optimized memory arrayINFINEON TECHNOLOGIES AG·Filed 2003·Granted Apr 5, 2005·5 cites·25 claims
- 3451US6850448B2Temperature-dependent refresh cycle for DRAMINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 1, 2005·7 cites·16 claims
- 3551US6532188B2Integrated memory having a row access controller for activating and deactivating row linesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 11, 2003·7 cites·4 claims
- 3651US6434725B1Method and system for semiconductor testing using yield correlation between global and class parametersINFINEON TECHNOLOGIES RICHMOND·Filed 2000·Granted Aug 13, 2002·6 cites·26 claims
- 3749US7126870B2Integrated semiconductor memory with sense amplifierINFINEON TECHNOLOGIES AG·Filed 2005·Granted Oct 24, 2006·2 cites·16 claims
- 3849US6751135B2Method for driving memory cells of a dynamic semiconductor memory and circuit configurationINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 15, 2004·6 cites·9 claims
- 3947US9646710B2Semiconductor device with channel switching structure and method of making sameSOMMER MICHAEL·Filed 2012·Granted May 9, 2017·0 cites·19 claims
- 4046US7961514B2Semiconductor device, a method of using a semiconductor device, a programmable memory device, and method of producing a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2009·Granted Jun 14, 2011·0 cites·25 claims
- 4146US2006281269A1Method and structure of an auxiliary transistor arrangement used for fabricating a semiconductor memory deviceSOMMER MICHAEL BERNHARD·Filed 2006·Application pending·0 cites
- 4244US6930540B2Integrated circuit with voltage divider and buffered capacitorINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 16, 2005·4 cites·6 claims
- 4343US8670270B2Method of operating phase-change memoryOTTERSTEDT JAN·Filed 2012·Granted Mar 11, 2014·0 cites·22 claims
- 4443US7939946B2Chip with a vertical contact structureINFINEON TECHNOLOGIES AG·Filed 2007·Granted May 10, 2011·0 cites·17 claims
- 4541US6434503B1Automated creation of specific test programs from complex test programsINFINEON TECHNOLOGIES RICHMOND·Filed 1999·Granted Aug 13, 2002·12 cites·23 claims
- 4640US8125821B2Method of operating phase-change memoryOTTERSTEDT JAN·Filed 2007·Granted Feb 28, 2012·0 cites·18 claims
- 4740US7872914B2Monitor structure for monitoring a change of a memory contentINFINEON TECHNOLOGIES AG·Filed 2008·Granted Jan 18, 2011·0 cites·25 claims
- 4840US7468549B2Method for producing a package for an electronic circuit and a substrate for a packageINFINEON TECHNOLOGIES AG·Filed 2005·Granted Dec 23, 2008·0 cites·17 claims
- 4940US7393721B2Semiconductor chip with metallization levels, and a method for formation in interconnect structuresINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jul 1, 2008·0 cites·5 claims
- 5040US7112496B2Method and structure of an auxiliary transistor arrangement used for fabricating a semiconductor memory deviceINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 26, 2006·0 cites·14 claims
Showing the top 50 of 65 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →