Inventor · disambiguated record
Jaime Bravo
Also filed as: BRAVO JAIME · BRAVO JAIME JAVIER
9 granted patents·29 citations·filing 2007–2023
83Inventor score
Files withGLOBALFOUNDRIES INC3ADVANCED MICRO DEVICES INC1FAIRCHILD SEMICONDUCTOR1IDEX HEALTH & SCIENCE LLC1IDEX HEALTH AND SCIENCE LLC1
Top patents by PatentIndex Score
9 records- 0190US7879304B1Monodisperse mesoporous silica microspheres formed by evaporation-induced self-assembly of surfactant templates in aerosolesSTC UNM·Filed 2008·Granted Feb 1, 2011·11 cites·23 claims
- 0278US7679200B2Semiconductor chip with crack stopGLOBALFOUNDRIES INC·Filed 2007·Granted Mar 16, 2010·8 cites·20 claims
- 0374US7897433B2Semiconductor chip with reinforcement layer and method of making the sameADVANCED MICRO DEVICES INC·Filed 2009·Granted Mar 1, 2011·6 cites·21 claims
- 0469US12429681B2Fluid immersion control for inverted microscopyIDEX HEALTH & SCIENCE LLC·Filed 2023·Granted Sep 30, 2025·0 cites·26 claims
- 0566US9112346B2Input power protectionFAIRCHILD SEMICONDUCTOR·Filed 2013·Granted Aug 18, 2015·2 cites·24 claims
- 0660US8174131B2Semiconductor device having a filled trench structure and methods for fabricating the sameZHANG ZHEN·Filed 2009·Granted May 8, 2012·2 cites·20 claims
- 0753US11644658B2Fluid immersion control for inverted microscopyIDEX HEALTH AND SCIENCE LLC·Filed 2021·Granted May 9, 2023·0 cites·31 claims
- 0845US10311186B2Three-dimensional pattern risk scoringGLOBALFOUNDRIES INC·Filed 2016·Granted Jun 4, 2019·0 cites·14 claims
- 0939US10078107B2Wafer level electrical test for optical proximity correction and/or etch biasGLOBALFOUNDRIES INC·Filed 2015·Granted Sep 18, 2018·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →