Inventor · disambiguated record
Toshiki Kanamoto
Also filed as: KANAMOTO TOSHIKI
9 granted patents·2 pending applications·201 citations·filing 1998–2012
88Inventor score
Files withRENESAS TECH CORP4MITSUBISHI ELECTRIC CORP3MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2RENESAS ELECTRONICS CORP2
Top patents by PatentIndex Score
11 records- 0191US6504186B2Semiconductor device having a library of standard cells and method of designing the sameMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jan 7, 2003·130 cites·1 claims
- 0281US7230435B2Capacitance measurement circuitMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jun 12, 2007·25 cites·8 claims
- 0363US9405873B2Method for improved accuracy of a substrate parasitic-resistance extraction in a circuit simulationRENESAS ELECTRONICS CORP·Filed 2012·Granted Aug 2, 2016·2 cites·6 claims
- 0462US7398506B2Net list producing device producing a net list with an interconnection parasitic element by hierarchical processingRENESAS TECH CORP·Filed 2006·Granted Jul 8, 2008·4 cites·5 claims
- 0558US7432581B2Semiconductor device, method of manufacture thereof and semiconductor integrated circuitRENESAS TECH CORP·Filed 2006·Granted Oct 7, 2008·2 cites·9 claims
- 0658US6982555B2Semiconductor deviceMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2004·Granted Jan 3, 2006·8 cites·12 claims
- 0755US6728943B2Semiconductor circuit extraction apparatus and methodMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 27, 2004·7 cites·1 claims
- 0846US6442740B1Clock signal analysis device and clock signal analysis methodMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Aug 27, 2002·23 cites·15 claims
- 0946US2009011568A1Semiconductor device, method of manufacture thereof and semiconductor integrated circuitRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 1045US7979817B2Net list producing device producing a net list with an interconnection parasitic element by hierarchical processingRENESAS ELECTRONICS CORP·Filed 2008·Granted Jul 12, 2011·0 cites·5 claims
- 1143US2004158805A1Parasitic capacitance extracting device and method for semiconductor integrated circuitRENESAS TECH CORP·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →