Inventor · disambiguated record
Alan Frank De Jong
Also filed as: DE JONG ALAN F · DE JONG ALAN FRANK
12 granted patents·238 citations·filing 1992–2017
91Inventor score
Top patents by PatentIndex Score
12 records- 0194US8581189B2Charged particle microscopy imaging methodBOUGHORBEL FAYSAL·Filed 2012·Granted Nov 12, 2013·18 cites·20 claims
- 0293US7915584B2TEM with aberration corrector and phase plateFEI CO·Filed 2009·Granted Mar 29, 2011·19 cites·26 claims
- 0391US5221844ACharged particle beam devicePHILIPS CORP·Filed 1992·Granted Jun 22, 1993·71 cites·15 claims
- 0489US5986270AParticle-optical apparatus including a low-temperature specimen holderPHILIPS CORP·Filed 1997·Granted Nov 16, 1999·71 cites·14 claims
- 0581US8598542B2Charged particle beam processingTOTH MILOS·Filed 2010·Granted Dec 3, 2013·5 cites·8 claims
- 0679US8592762B2Method of using a direct electron detector for a TEMLUECKEN UWE·Filed 2011·Granted Nov 26, 2013·5 cites·13 claims
- 0778US5448063AEnergy filter with correction of a second-order chromatic aberrationPHILIPS CORP·Filed 1994·Granted Sep 5, 1995·35 cites·6 claims
- 0874US8692196B2Method of use for a multipole detector for a transmission electron microscopeTIEMEIJER PETER CHRISTIAAN·Filed 2009·Granted Apr 8, 2014·4 cites·11 claims
- 0967US9162211B2Micro-reactor for observing particles in a fluidVAN VEEN GERARD ANNE NICOLAAS·Filed 2010·Granted Oct 20, 2015·3 cites·24 claims
- 1064US8597565B2Method for forming microscopic 3D structuresFABER JACOB SIMON·Filed 2010·Granted Dec 3, 2013·2 cites·23 claims
- 1139US9958403B1Arrangement for X-Ray tomographyFEI CO·Filed 2017·Granted May 1, 2018·0 cites·20 claims
- 1236US5233192AMethod for autotuning of an electron microscope, and an electron microscope suitable for carrying out such a methodPHILIPS CORP·Filed 1992·Granted Aug 3, 1993·5 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →