Inventor · disambiguated record
Krishnendu Mondal
Also filed as: MONDAL KRISHNENDU
22 granted patents·174 citations·filing 2002–2019
94Inventor score
Top patents by PatentIndex Score
22 records- 0192US6768694B2Method of electrically blowing fuses under control of an on-chip tester interface apparatusIBM·Filed 2002·Granted Jul 27, 2004·84 cites·44 claims
- 0287US9881694B2Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2015·Granted Jan 30, 2018·6 cites·20 claims
- 0382US6928377B2Self-test architecture to implement data column redundancy in a RAMIBM·Filed 2003·Granted Aug 9, 2005·33 cites·15 claims
- 0479US8914688B2System and method of reducing test time via address aware BIST circuitryIBM·Filed 2012·Granted Dec 16, 2014·8 cites·25 claims
- 0579US8853847B2Stacked chip module with integrated circuit chips having integratable and reconfigurable built-in self-maintenance blocksIBM·Filed 2012·Granted Oct 7, 2014·5 cites·25 claims
- 0678US10026498B1Simultaneous scan chain initialization with disparate latchesIBM·Filed 2017·Granted Jul 17, 2018·3 cites·17 claims
- 0775US10199121B2Simultaneous scan chain initialization with disparate latchesIBM·Filed 2018·Granted Feb 5, 2019·2 cites·2 claims
- 0873US10096377B1Simultaneous scan chain initialization with disparate latchesIBM·Filed 2017·Granted Oct 9, 2018·2 cites·1 claims
- 0973US6922649B2Multiple on-chip test runs and repairs for memoriesIBM·Filed 2003·Granted Jul 26, 2005·20 cites·20 claims
- 1068US10971243B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2019·Granted Apr 6, 2021·1 cites·20 claims
- 1167US8918690B2Decreasing power supply demand during BIST initializationsIBM·Filed 2013·Granted Dec 23, 2014·3 cites·20 claims
- 1266US10692584B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2017·Granted Jun 23, 2020·1 cites·16 claims
- 1366US10014074B2Failure analysis and repair register sharing for memory BISTGLOBALFOUNDRIES INC·Filed 2016·Granted Jul 3, 2018·2 cites·20 claims
- 1466US8872322B2Stacked chip module with integrated circuit chips having integratable built-in self-maintenance blocksINTERNAT BUSINESSS MACHINES CORP·Filed 2012·Granted Oct 28, 2014·2 cites·25 claims
- 1555US11295829B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2019·Granted Apr 5, 2022·0 cites·19 claims
- 1654US10658062B2Simultaneous scan chain initialization with disparate latchesIBM·Filed 2019·Granted May 19, 2020·0 cites·8 claims
- 1754US9761329B2Built-in self-test (BIST) circuit and associated BIST method for embedded memoriesGLOBALFOUNDRIES INC·Filed 2015·Granted Sep 12, 2017·1 cites·20 claims
- 1854US9715942B2Built-in self-test (BIST) circuit and associated BIST method for embedded memoriesIBM·Filed 2015·Granted Jul 25, 2017·1 cites·20 claims
- 1953US10586606B2Simultaneous scan chain initialization with disparate latchesIBM·Filed 2019·Granted Mar 10, 2020·0 cites·17 claims
- 2050US10553302B2Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask registerIBM·Filed 2017·Granted Feb 4, 2020·0 cites·20 claims
- 2149US9859019B1Programmable counter to control memory built in self-testIBM·Filed 2017·Granted Jan 2, 2018·0 cites·20 claims
- 2238US9773570B2Built-in-self-test (BIST) test time reductionIBM·Filed 2013·Granted Sep 26, 2017·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →