Inventor · disambiguated record
Hoyoung Kang
Also filed as: KANG HOYOUNG
23 granted patents·7 pending applications·29 citations·filing 2004–2024
91Inventor score
Top patents by PatentIndex Score
30 records- 0193US9385129B2Method of forming a memory capacitor structure using a self-assembly patternTOKYO ELECTRON LTD·Filed 2015·Granted Jul 5, 2016·12 cites·20 claims
- 0292US10068764B2Selective metal oxide deposition using a self-assembled monolayer surface pretreatmentTOKYO ELECTRON LTD·Filed 2017·Granted Sep 4, 2018·7 cites·20 claims
- 0389US11791167B2Cyclic self-limiting etch processTOKYO ELECTRON LTD·Filed 2020·Granted Oct 17, 2023·2 cites·20 claims
- 0487US10115726B2Method and system for forming memory fin patternsTOKYO ELECTRON LTD·Filed 2017·Granted Oct 30, 2018·4 cites·19 claims
- 0582US11460775B2Method and system for prevention of metal contamination by using a self-assembled monolayer coatingTOKYO ELECTRON LTD·Filed 2019·Granted Oct 4, 2022·2 cites·20 claims
- 0674US12341053B2System for backside deposition of a substrateTOKYO ELECTRON LTD·Filed 2024·Granted Jun 24, 2025·0 cites·20 claims
- 0769US11484993B2Substrate holding apparatus and method for shape metrologyTOKYO ELECTRON LTD·Filed 2022·Granted Nov 1, 2022·0 cites·14 claims
- 0868US2023340496A1Aptamer template and method for preparing aptamer by using sameNUCLIXBIO·Filed 2023·Application pending·0 cites
- 0965US11314166B2Fast imprint lithographyTOKYO ELECTRON LTD·Filed 2021·Granted Apr 26, 2022·0 cites·15 claims
- 1065US9508557B2Method of improving line roughness in substrate processingTOKYO ELECTRON LTD·Filed 2015·Granted Nov 29, 2016·1 cites·19 claims
- 1160US2025132180A1Wafer bow metrology systemTOKYO ELECTRON LTD·Filed 2024·Application pending·0 cites
- 1259US2025189302A1Methods of estimating line width and systems thereofTOKYO ELECTRON LTD·Filed 2023·Application pending·0 cites
- 1358US12505353B2Method and apparatus for training language model for multi-modal dialogSAMSUNG SDS CO LTD·Filed 2022·Granted Dec 23, 2025·0 cites·16 claims
- 1458US10890843B2Fast imprint lithographyTOKYO ELECTRON LTD·Filed 2018·Granted Jan 12, 2021·0 cites·18 claims
- 1556US11247309B2Substrate holding apparatus and method for shape metrologyTOKYO ELECTRON LTD·Filed 2019·Granted Feb 15, 2022·0 cites·9 claims
- 1655US10525416B2Method of liquid filter wettingTOKYO ELECTRON LTD·Filed 2017·Granted Jan 7, 2020·0 cites·20 claims
- 1755US2024170307A1High Heat Capacity Hot PlateTOKYO ELECTRON LTD·Filed 2022·Application pending·0 cites
- 1854US11908728B2System for backside deposition of a substrateTOKYO ELECTRON LTD·Filed 2018·Granted Feb 20, 2024·0 cites·20 claims
- 1954US2019027481A1Method and system for forming memory fin patternsTOKYO ELECTRON LTD·Filed 2018·Application pending·0 cites
- 2053US12119643B2Data collection apparatus of power systemLS ELECTRIC CO LTD·Filed 2021·Granted Oct 15, 2024·0 cites·9 claims
- 2152US11043378B2Systems and methods for inhibiting detectivity, metal particle contamination, and film growth on wafersTOKYO ELECTRON LTD·Filed 2019·Granted Jun 22, 2021·0 cites·20 claims
- 2251US11567407B2Method for globally adjusting spacer critical dimension using photo-active self-assembled monolayerTOKYO ELECTRON LTD·Filed 2019·Granted Jan 31, 2023·0 cites·18 claims
- 2351US2020332296A1Aptamer template and method for preparing aptamer by using sameNUCLIXBIO·Filed 2018·Application pending·0 cites
- 2447US12354991B2Replacement buried power rail in backside power deliveryTOKYO ELECTRON LTD·Filed 2020·Granted Jul 8, 2025·0 cites·3 claims
- 2546US10707070B2Methods and systems for coating a substrate with a fluidTOKYO ELECTRON LTD·Filed 2018·Granted Jul 7, 2020·0 cites·20 claims
- 2645US10784100B2Back-side friction reduction of a substrateTOKYO ELECTRON LTD·Filed 2017·Granted Sep 22, 2020·0 cites·12 claims
- 2745US7071124B1Method to reduce PEB sensitivity of resistCYPRESS SEMICONDUCTOR CORP·Filed 2004·Granted Jul 4, 2006·1 cites·19 claims
- 2841US11193314B2Emergency escape apparatus for a buildingKANG HOYOUNG·Filed 2018·Granted Dec 7, 2021·0 cites·20 claims
- 2941US10504715B2Back-side friction reduction of a substrateTOKYO ELECTRON LTD·Filed 2017·Granted Dec 10, 2019·0 cites·7 claims
- 3036US2014313810A1Switchably coupled digit line segments in a memory deviceMICRON TECHNOLOGY INC·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →