Inventor · disambiguated record
Shih-Yin Hsiao
Also filed as: HSIAO SHIH-YIN
55 granted patents·6 pending applications·143 citations·filing 2000–2023
98Inventor score
Files withUNITED MICROELECTRONICS CORP61
Top patents by PatentIndex Score
61 records- 0195US9391196B1High-voltage metal-oxide-semiconductor transistor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jul 12, 2016·20 cites·12 claims
- 0294US9741850B1Semiconductor device and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Aug 22, 2017·12 cites·25 claims
- 0392US9761657B2Metal-oxide-semiconductor transistor and method of forming gate layoutUNITED MICROELECTRONICS CORP·Filed 2015·Granted Sep 12, 2017·8 cites·7 claims
- 0492US9406771B1Semiconductor structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Aug 2, 2016·10 cites·12 claims
- 0591US10373872B2Transistor structureUNITED MICROELECTRONICS CORP·Filed 2017·Granted Aug 6, 2019·5 cites·15 claims
- 0691US9985129B2High-voltage metal-oxide-semiconductor transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted May 29, 2018·6 cites·7 claims
- 0791US9716139B2Method for forming high voltage transistorUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jul 25, 2017·8 cites·18 claims
- 0888US10008573B1High-voltage metal-oxide-semiconductor transistor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jun 26, 2018·7 cites·19 claims
- 0987US9859417B2High-voltage metal-oxide-semiconductor transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jan 2, 2018·4 cites·14 claims
- 1087US9583617B2Semiconductor device and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Feb 28, 2017·4 cites·10 claims
- 1187US9570451B1Method to form semiconductor devicesUNITED MICROELECTRONICS CORP·Filed 2016·Granted Feb 14, 2017·6 cites·20 claims
- 1286US9577069B1Method of fabricating semiconductor MOS deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Feb 21, 2017·5 cites·12 claims
- 1385US9728616B2High-voltage metal-oxide-semiconductor transistor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Aug 8, 2017·5 cites·24 claims
- 1484US10204996B2Metal-oxide-semiconductor transistor and method of forming gate layoutUNITED MICROELECTRONICS CORP·Filed 2017·Granted Feb 12, 2019·3 cites·5 claims
- 1584US9722072B2Manufacturing method of high-voltage metal-oxide-semiconductor transistorUNITED MICROELECTRONICS CORP·Filed 2016·Granted Aug 1, 2017·4 cites·15 claims
- 1683US9972678B2Semiconductor device and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 15, 2018·3 cites·17 claims
- 1782US10020393B2Laterally diffused metal-oxide-semiconductor transistor and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Jul 10, 2018·4 cites·10 claims
- 1881US12087635B2Transistor structureUNITED MICROELECTRONICS CORP·Filed 2023·Granted Sep 10, 2024·0 cites·15 claims
- 1981US10297455B2Gate oxide structure and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 21, 2019·4 cites·14 claims
- 2081US9349818B2Metal-oxide-semiconductor transistor device having a drain side dummy contactUNITED MICROELECTRONICS CORP·Filed 2014·Granted May 24, 2016·4 cites·12 claims
- 2180US10903334B2High voltage semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2020·Granted Jan 26, 2021·1 cites·7 claims
- 2280US10411088B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Sep 10, 2019·2 cites·19 claims
- 2377US9196695B2High-voltage metal-oxide semiconductor transistor and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 24, 2015·3 cites·7 claims
- 2476US9929056B1Method for forming gate structures in different operation voltagesUNITED MICROELECTRONICS CORP·Filed 2016·Granted Mar 27, 2018·3 cites·16 claims
- 2576US9806150B2High voltage device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2017·Granted Oct 31, 2017·2 cites·11 claims
- 2676US9461133B1High voltage metal-oxide-semiconductor transistor device having stepped gate structure and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2015·Granted Oct 4, 2016·2 cites·9 claims
- 2774US10373876B2Method for preventing dishing during the manufacture of semiconductor devicesUNITED MICROELECTRONICS CORP·Filed 2018·Granted Aug 6, 2019·1 cites·7 claims
- 2874US9680010B1High voltage device and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 13, 2017·2 cites·8 claims
- 2973US11721587B2Transistor structureUNITED MICROELECTRONICS CORP·Filed 2021·Granted Aug 8, 2023·0 cites·17 claims
- 3072US11088027B2Transistor structureUNITED MICROELECTRONICS CORP·Filed 2020·Granted Aug 10, 2021·0 cites·6 claims
- 3169US9978647B2Method for preventing dishing during the manufacture of semiconductor devicesUNITED MICROELECTRONICS CORP·Filed 2015·Granted May 22, 2018·1 cites·15 claims
- 3267US10147800B2Method of fabricating a transistor with reduced hot carrier injection effectsUNITED MICROELECTRONICS CORP·Filed 2016·Granted Dec 4, 2018·1 cites·14 claims
- 3367US9691911B1Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2016·Granted Jun 27, 2017·1 cites·20 claims
- 3464US10796964B2Transistor structureUNITED MICROELECTRONICS CORP·Filed 2019·Granted Oct 6, 2020·0 cites·7 claims
- 3563US9472661B1Semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2015·Granted Oct 18, 2016·1 cites·16 claims
- 3663US2021119014A1High voltage semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2020·Application pending·0 cites
- 3756US10290718B2Metal-oxide-semiconductor transistor and method of forming gate layoutUNITED MICROELECTRONICS CORP·Filed 2017·Granted May 14, 2019·0 cites·6 claims
- 3856US9755046B2Method of forming semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Sep 5, 2017·0 cites·10 claims
- 3955US10629697B2High voltage semiconductor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2016·Granted Apr 21, 2020·0 cites·6 claims
- 4054US10373837B2Memory deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Aug 6, 2019·0 cites·9 claims
- 4153US10586735B2Semiconductor device structure including high voltage MOS deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Mar 10, 2020·0 cites·9 claims
- 4253US9490316B2Semiconductor structure with silicon oxide layer having a top surface in the shape of plural hills and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2014·Granted Nov 8, 2016·0 cites·12 claims
- 4352US10340349B2Method of forming semiconductor structureUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jul 2, 2019·0 cites·8 claims
- 4452US9812327B2Semiconductor device and method of forming the sameUNITED MICROELECTRONICS CORP·Filed 2015·Granted Nov 7, 2017·0 cites·13 claims
- 4552US9466694B2Metal-oxide-semiconductor transistor device and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2016·Granted Oct 11, 2016·0 cites·8 claims
- 4650US9922881B2Method for fabricating semiconductor device structure and product thereofUNITED MICROELECTRONICS CORP·Filed 2016·Granted Mar 20, 2018·0 cites·14 claims
- 4750US9484422B2High-voltage metal-oxide semiconductor transistorUNITED MICROELECTRONICS CORP·Filed 2015·Granted Nov 1, 2016·0 cites·12 claims
- 4848US10312379B2High voltage deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jun 4, 2019·0 cites·18 claims
- 4946US10354878B2Doping method for semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jul 16, 2019·0 cites·15 claims
- 5046US9947746B2Bipolar junction transistor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Apr 17, 2018·0 cites·17 claims
Showing the top 50 of 61 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →