Inventor · disambiguated record
Futoshi Igaue
Also filed as: IGAUE FUTOSHI
11 granted patents·1 pending application·40 citations·filing 2001–2018
87Inventor score
Top patents by PatentIndex Score
12 records- 0178US8599639B2Semiconductor device including internal voltage generation circuitRENESAS ELECTRONICS CORP·Filed 2013·Granted Dec 3, 2013·4 cites·5 claims
- 0276US9824757B2Semiconductor device including TCAM cell arrays capable of skipping TCAM-cell search in response to control signalRENESAS ELECTRONICS CORP·Filed 2016·Granted Nov 21, 2017·3 cites·17 claims
- 0375US8004923B2Semiconductor device including internal voltage generation circuitRENESAS ELECTRONICS CORP·Filed 2010·Granted Aug 23, 2011·3 cites·2 claims
- 0472US7408818B2Semiconductor device undergoing defect detection testRENESAS TECH CORP·Filed 2007·Granted Aug 5, 2008·7 cites·10 claims
- 0570US6472716B2Semiconductor device with a well wherein a scaling down of the layout is achievedMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 29, 2002·16 cites·16 claims
- 0664US10121541B2Semiconductor device and information processing systemRENESAS ELECTRONICS CORP·Filed 2016·Granted Nov 6, 2018·2 cites·16 claims
- 0762US10068646B2Semiconductor device including TCAM cell arrays capable of skipping TCAM-cell search in response to control signalRENESAS ELECTRONICS CORP·Filed 2017·Granted Sep 4, 2018·1 cites·7 claims
- 0862US7656736B2Semiconductor device including internal voltage generation circuitRENESAS TECH CORP·Filed 2007·Granted Feb 2, 2010·3 cites·3 claims
- 0955US8451678B2Semiconductor device including internal voltage generation circuitAKIYAMA MIHOKO·Filed 2011·Granted May 28, 2013·1 cites·2 claims
- 1050US10366755B2Semiconductor device including TCAM cell arrays capable of skipping TCAM-cell search in response to control signalRENESAS ELECTRONICS CORP·Filed 2018·Granted Jul 30, 2019·0 cites·6 claims
- 1140US2008298156A1Semiconductor device undergoing defect detection testRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 1236US10910055B2System and method for reducing power consumption of memory deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted Feb 2, 2021·0 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →