Inventor · disambiguated record
Yuji Ebiike
Also filed as: EBIIKE YUJI
11 granted patents·5 pending applications·31 citations·filing 2011–2024
83Inventor score
Top patents by PatentIndex Score
16 records- 0191US8785931B2Semiconductor deviceKINOUCHI SHINICHI·Filed 2011·Granted Jul 22, 2014·23 cites·18 claims
- 0289US11984492B2Silicon carbide semiconductor device, power converter, and method of manufacturing silicon carbide semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2022·Granted May 14, 2024·1 cites·6 claims
- 0376US9093361B2Semiconductor deviceHINO SHIRO·Filed 2012·Granted Jul 28, 2015·5 cites·12 claims
- 0464US12484238B2Semiconductor apparatusMITSUBISHI ELECTRIC CORP·Filed 2022·Granted Nov 25, 2025·0 cites·19 claims
- 0559US2025169088A1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 0657US9190468B2Semiconductor deviceHINO SHIRO·Filed 2012·Granted Nov 17, 2015·1 cites·9 claims
- 0754US9059086B2Method of manufacturing semiconductor deviceEBIIKE YUJI·Filed 2011·Granted Jun 16, 2015·1 cites·12 claims
- 0854US2024429282A1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 0954US2019348524A1Silicon carbide semiconductor device, power converter, and method of manufacturing silicon carbide semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2019·Application pending·0 cites
- 1050US11380596B2Semiconductor test apparatus, semiconductor device test method, and semiconductor device manufacturing methodMITSUBISHI ELECTRIC CORP·Filed 2020·Granted Jul 5, 2022·0 cites·10 claims
- 1150US2024322022A1Semiconductor device and method for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 1249US2024113208A1Semiconductor device and method for manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2023·Application pending·0 cites
- 1347US9972676B2Silicon carbide semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2014·Granted May 15, 2018·0 cites·10 claims
- 1446US10276711B2Semiconductor device and method of manufacturing the sameMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Apr 30, 2019·0 cites·10 claims
- 1540US10802047B2Inspection device and inspection methodMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Oct 13, 2020·0 cites·17 claims
- 1635US10164083B2Silicon carbide semiconductor device and manufacturing method thereforMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Dec 25, 2018·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →