Inventor · disambiguated record
Huaxing Tang
Also filed as: TANG HUAXING
16 granted patents·5 pending applications·157 citations·filing 2004–2021
92Inventor score
Top patents by PatentIndex Score
21 records- 0197US7512508B2Determining and analyzing integrated circuit yield and qualityRAJSKI JANUSZ·Filed 2005·Granted Mar 31, 2009·54 cites·57 claims
- 0296US7987442B2Fault dictionaries for integrated circuit yield and quality analysis methods and systemsMENTOR GRAPHICS CORP·Filed 2005·Granted Jul 26, 2011·38 cites·42 claims
- 0394US10657207B1Inter-cell bridge defect diagnosisMENTOR GRAPHICS CORP·Filed 2018·Granted May 19, 2020·16 cites·19 claims
- 0494US10592625B1Cell-aware root cause deconvolution for defect diagnosis and yield analysisMENTOR GRAPHICS CORP·Filed 2018·Granted Mar 17, 2020·17 cites·18 claims
- 0591US11042679B1Diagnosis resolution predictionMENTOR GRAPHICS CORP·Filed 2020·Granted Jun 22, 2021·3 cites·20 claims
- 0687US11227091B1Physical failure analysis-oriented diagnosis resolution predictionSIEMENS IND SOFTWARE INC·Filed 2021·Granted Jan 18, 2022·2 cites·20 claims
- 0787US10234502B1Circuit defect diagnosis based on sink cell fault modelsMENTOR GRAPHICS CORP·Filed 2017·Granted Mar 19, 2019·3 cites·20 claims
- 0881US10795751B2Cell-aware diagnostic pattern generation for logic diagnosisMENTOR GRAPHICS CORP·Filed 2018·Granted Oct 6, 2020·2 cites·18 claims
- 0971US12001973B2Machine learning-based adjustments in volume diagnosis procedures for determination of root cause distributionsSIEMENS IND SOFTWARE INC·Filed 2019·Granted Jun 4, 2024·2 cites·17 claims
- 1071US9244125B2Dynamic design partitioning for scan chain diagnosisMENTOR GRAPHICS CORP·Filed 2013·Granted Jan 26, 2016·2 cites·15 claims
- 1171US8201131B2Generating test patterns having enhanced coverage of untargeted defectsRAJSKI JANUSZ·Filed 2009·Granted Jun 12, 2012·4 cites·24 claims
- 1269US9336107B2Dynamic design partitioning for diagnosisMENTOR GRAPHICS CORP·Filed 2012·Granted May 10, 2016·2 cites·19 claims
- 1366US7509600B2Generating test patterns having enhanced coverage of untargeted defectsRAJSKI JANUSZ·Filed 2004·Granted Mar 24, 2009·10 cites·58 claims
- 1464US8707232B2Fault diagnosis based on design partitioningTANG HUAXING·Filed 2012·Granted Apr 22, 2014·2 cites·20 claims
- 1555US2015135030A1Speeding up defect diagnosis techniquesMENTOR GRAPHICS CORP·Filed 2014·Application pending·0 cites
- 1652US9857421B2Dynamic design partitioning for diagnosisMENTOR GRAPHICS CORP·Filed 2016·Granted Jan 2, 2018·0 cites·14 claims
- 1748US2009287438A1Increased Fault Diagnosis Throughput Using Dictionaries For Hyperactive FaultsCHENG WU-TUNG·Filed 2008·Application pending·0 cites
- 1847US2009210183A1Determining and analyzing integrated circuit yield and qualityRAJSKI JANUSZ·Filed 2009·Application pending·0 cites
- 1944US8812922B2Speeding up defect diagnosis techniquesZOU WEI·Filed 2007·Granted Aug 19, 2014·0 cites·48 claims
- 2037US2018217204A1Counter-Based Scan Chain DiagnosisMENTOR GRAPHICS CORP·Filed 2017·Application pending·0 cites
- 2136US2015234978A1Cell Internal Defect DiagnosisMENTOR GRAPHICS CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →