Inventor · disambiguated record
Darren L. Anand
Also filed as: ANAND DARREN · ANAND DARREN L · ANAND DARREN LANE
50 granted patents·2 pending applications·721 citations·filing 1999–2022
98Inventor score
Top patents by PatentIndex Score
52 records- 0196US10468104B1Robust and error free physical unclonable function using twin-cell charge trap transistor memoryGLOBALFOUNDRIES INC·Filed 2018·Granted Nov 5, 2019·27 cites·16 claims
- 0296US9953727B1Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testingGLOBALFOUNDRIES INC·Filed 2017·Granted Apr 24, 2018·19 cites·12 claims
- 0396US9508420B1Voltage-aware adaptive static random access memory (SRAM) write assist circuitGLOBALFOUNDRIES INC·Filed 2016·Granted Nov 29, 2016·22 cites·15 claims
- 0495US7984329B2System and method for providing DRAM device-level repair via address remappings external to the deviceIBM·Filed 2007·Granted Jul 19, 2011·41 cites·22 claims
- 0595US7251756B2Method and apparatus for increasing fuse programming yield through preferred use of duplicate dataIBM·Filed 2005·Granted Jul 31, 2007·51 cites·30 claims
- 0695US6577156B2Method and apparatus for initializing an integrated circuit using compressed data from a remote fuseboxIBM·Filed 2000·Granted Jun 10, 2003·106 cites·28 claims
- 0794US7307911B1Apparatus and method for improving sensing margin of electrically programmable fusesIBM·Filed 2006·Granted Dec 11, 2007·30 cites·20 claims
- 0893US8484543B2Fusebay controller structure, system, and methodANAND DARREN L·Filed 2011·Granted Jul 9, 2013·28 cites·20 claims
- 0992US7170299B1Electronic fuse blow mimic and methods for adjusting electronic fuse blowIBM·Filed 2006·Granted Jan 30, 2007·25 cites·20 claims
- 1092US6768694B2Method of electrically blowing fuses under control of an on-chip tester interface apparatusIBM·Filed 2002·Granted Jul 27, 2004·84 cites·44 claims
- 1189US5978281AMethod and apparatus for preventing postamble corruption within a memory systemIBM·Filed 1999·Granted Nov 2, 1999·76 cites·17 claims
- 1288US9281045B1Refresh hidden eDRAM memoryIBM·Filed 2014·Granted Mar 8, 2016·11 cites·12 claims
- 1388US7512915B2Embedded test circuit for testing integrated circuits at the die levelIBM·Filed 2007·Granted Mar 31, 2009·14 cites·19 claims
- 1486US7911820B2Regulating electrical fuse programming currentIBM·Filed 2008·Granted Mar 22, 2011·17 cites·20 claims
- 1586US7382149B2System for acquiring device parametersIBM·Filed 2006·Granted Jun 3, 2008·15 cites·20 claims
- 1681US11962709B1Structures and methods for deriving stable physical unclonable functions from semiconductor devicesMARVELL ASIA PTE LTD·Filed 2021·Granted Apr 16, 2024·1 cites·16 claims
- 1781US11418195B1Voltage power switchMARVELL ASIA PTE LTD·Filed 2021·Granted Aug 16, 2022·1 cites·20 claims
- 1881US7315193B2Circuitry and method for programming an electrically programmable fuseIBM·Filed 2005·Granted Jan 1, 2008·10 cites·8 claims
- 1979US7895028B2Structure for increasing fuse programming yieldIBM·Filed 2007·Granted Feb 22, 2011·11 cites·8 claims
- 2075US9779783B2Latching current sensing amplifier for memory arrayIBM·Filed 2015·Granted Oct 3, 2017·3 cites·15 claims
- 2173US7444564B2Automatic bit fail mapping for embedded memories with clock multipliersIBM·Filed 2003·Granted Oct 28, 2008·23 cites·12 claims
- 2273US7061304B2Fuse latch with compensated programmable resistive trip pointIBM·Filed 2004·Granted Jun 13, 2006·18 cites·20 claims
- 2372US7609577B2Design structure for improving sensing margin of electrically programmable fusesIBM·Filed 2007·Granted Oct 27, 2009·6 cites·10 claims
- 2472US7477555B2System and method for differential eFUSE sensing without reference fusesIBM·Filed 2006·Granted Jan 13, 2009·8 cites·12 claims
- 2571US11742858B1Voltage power switchMARVELL ASIA PTE LTD·Filed 2022·Granted Aug 29, 2023·0 cites·20 claims
- 2671US8028195B2Structure for indicating status of an on-chip power supply systemIBM·Filed 2008·Granted Sep 27, 2011·5 cites·11 claims
- 2767US10685705B2Program and erase memory structuresGLOBALFOUNDRIES INC·Filed 2018·Granted Jun 16, 2020·1 cites·20 claims
- 2867US10062445B2Parallel programming of one time programmable memory array for reduced test timeGLOBALFOUNDRIES INC·Filed 2016·Granted Aug 28, 2018·2 cites·20 claims
- 2966US8773920B2Reference generator with programmable M and B parameters and methods of useANAND DARREN L·Filed 2012·Granted Jul 8, 2014·3 cites·27 claims
- 3062US7089136B2Method for reduced electrical fusing timeIBM·Filed 2003·Granted Aug 8, 2006·12 cites·17 claims
- 3162US6552938B1Column redundancy system and method for embedded DRAM devices with multibanking capabilityIBM·Filed 2001·Granted Apr 22, 2003·12 cites·20 claims
- 3260US6944090B2Method and circuit for precise timing of signals in an embedded DRAM arrayIBM·Filed 2003·Granted Sep 13, 2005·10 cites·30 claims
- 3357US10826489B1Selection circuitMARVELL INT LTD·Filed 2019·Granted Nov 3, 2020·1 cites·21 claims
- 3457US6728159B2Flexible multibanking interface for embedded memory applicationsIBM·Filed 2001·Granted Apr 27, 2004·9 cites·16 claims
- 3556US7917806B2System and method for indicating status of an on-chip power supply systemIBM·Filed 2007·Granted Mar 29, 2011·3 cites·18 claims
- 3652US11367734B2Charge trap memory devicesGLOBALFOUNDRIES US INC·Filed 2020·Granted Jun 21, 2022·0 cites·20 claims
- 3751US7688654B2Structure for differential eFUSE sensing without reference fusesIBM·Filed 2007·Granted Mar 30, 2010·2 cites·21 claims
- 3850US6788591B1System and method for direct write to dynamic random access memory (DRAM) using PFET bit-switchIBM·Filed 2003·Granted Sep 7, 2004·6 cites·24 claims
- 3949US10163526B2Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testingGLOBALFOUNDRIES INC·Filed 2018·Granted Dec 25, 2018·0 cites·12 claims
- 4048US10535379B2Latching current sensing amplifier for memory arrayGLOBALFOUNDRIES INC·Filed 2017·Granted Jan 14, 2020·0 cites·19 claims
- 4146US6995585B2System and method for implementing self-timed decoded data paths in integrated circuitsIBM·Filed 2003·Granted Feb 7, 2006·3 cites·17 claims
- 4245US2016181912A1Regulation for multi-phase voltage pump systemIBM·Filed 2014·Application pending·0 cites
- 4344US7920003B1Delay circuit with delay equal to percentage of input pulse widthIBM·Filed 2009·Granted Apr 5, 2011·0 cites·20 claims
- 4442US7525831B2Method for improving sensing margin of electrically programmable fusesIBM·Filed 2007·Granted Apr 28, 2009·0 cites·7 claims
- 4542US7243279B2Method for separating shift and scan paths on scan-only, single port LSSD latchesIBM·Filed 2003·Granted Jul 10, 2007·1 cites·20 claims
- 4641US10395752B2Margin test for multiple-time programmable memory (MTPM) with split wordlinesGLOBALFOUNDRIES INC·Filed 2017·Granted Aug 27, 2019·0 cites·20 claims
- 4741US7145977B2Diagnostic method and apparatus for non-destructively observing latch dataIBM·Filed 2003·Granted Dec 5, 2006·2 cites·23 claims
- 4841US6956415B2Modular DLL architecture for generating multiple timingsIBM·Filed 2003·Granted Oct 18, 2005·2 cites·22 claims
- 4940US7916826B2Diagnostic method and apparatus for non-destructively observing latch dataIBM·Filed 2008·Granted Mar 29, 2011·0 cites·17 claims
- 5038US7453973B2Diagnostic method and apparatus for non-destructively observing latch dataIBM·Filed 2006·Granted Nov 18, 2008·0 cites·6 claims
Showing the top 50 of 52 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →